{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,27]],"date-time":"2025-07-27T07:26:17Z","timestamp":1753601177268,"version":"3.37.3"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62071149","61671177"],"award-info":[{"award-number":["62071149","61671177"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tim.2023.3328704","type":"journal-article","created":{"date-parts":[[2023,10,30]],"date-time":"2023-10-30T18:55:54Z","timestamp":1698692154000},"page":"1-15","source":"Crossref","is-referenced-by-count":3,"title":["Sub-Nyquist Measurement of LFM Pulse Stream Based on Signal Separation and Parameter Matching"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0317-9697","authenticated-orcid":false,"given":"Ning","family":"Fu","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1256-6442","authenticated-orcid":false,"given":"Shuangxing","family":"Yun","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-6103-4886","authenticated-orcid":false,"given":"Bingtong","family":"Han","sequence":"additional","affiliation":[{"name":"Beijing Institute of Radio Measurement, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7397-3458","authenticated-orcid":false,"given":"Liyan","family":"Qiao","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3087319"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2885048"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3043085"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3063737"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3011601"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2988306"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2865531"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2983839"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2723342"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2017.2715832"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3060584"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914998"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2018.2858213"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2669900"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2011.2105480"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3071151"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2022.3157665"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2014.2366719"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2015.2507538"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2732453"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/iet-spr.2013.0354"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2016.07.015"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2016.2625274"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2020.3022816"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3164921"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/BF03549586"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC50364.2021.9460101"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3158986"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2020.3041089"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2021.3068353"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3261930"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10012124\/10301560.pdf?arnumber=10301560","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,11]],"date-time":"2024-04-11T05:01:46Z","timestamp":1712811706000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10301560\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3328704","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2023]]}}}