{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T15:34:10Z","timestamp":1772206450216,"version":"3.50.1"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2017YFA0700300"],"award-info":[{"award-number":["2017YFA0700300"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Sciences Foundation of China","doi-asserted-by":"publisher","award":["62125302"],"award-info":[{"award-number":["62125302"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Sciences Foundation of China","doi-asserted-by":"publisher","award":["61833003"],"award-info":[{"award-number":["61833003"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Sciences Foundation of China","doi-asserted-by":"publisher","award":["U1908218"],"award-info":[{"award-number":["U1908218"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Sciences Foundation of China","doi-asserted-by":"publisher","award":["62103075"],"award-info":[{"award-number":["62103075"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018617","name":"LiaoNing Revitalization Talents Program","doi-asserted-by":"publisher","award":["XLYC2002087"],"award-info":[{"award-number":["XLYC2002087"]}],"id":[{"id":"10.13039\/501100018617","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Sci-Tech Talent Innovation Support Program of Dalian","award":["2022RG03"],"award-info":[{"award-number":["2022RG03"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3331394","type":"journal-article","created":{"date-parts":[[2023,11,8]],"date-time":"2023-11-08T18:55:30Z","timestamp":1699469730000},"page":"1-11","source":"Crossref","is-referenced-by-count":12,"title":["Active Fault Diagnosis Based on Dual-Observer for Leakage Detection and Estimation With Adaptive Auxiliary Signal Mechanism in Industrial Gas Networks"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-3872-0461","authenticated-orcid":false,"given":"Demin","family":"Xu","sequence":"first","affiliation":[{"name":"Key Laboratory of Intelligent Control and Optimization for Industrial Equipment, Ministry of Education, Dalian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8393-8197","authenticated-orcid":false,"given":"Feng","family":"Jin","sequence":"additional","affiliation":[{"name":"Key Laboratory of Intelligent Control and Optimization for Industrial Equipment, Ministry of Education, Dalian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-9602-449X","authenticated-orcid":false,"given":"Fan","family":"Zhou","sequence":"additional","affiliation":[{"name":"Key Laboratory of Intelligent Control and Optimization for Industrial Equipment, Ministry of Education, Dalian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3573-152X","authenticated-orcid":false,"given":"Jun","family":"Zhao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Intelligent Control and Optimization for Industrial Equipment, Ministry of Education, Dalian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7608-7438","authenticated-orcid":false,"given":"Wei","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Intelligent Control and Optimization for Industrial Equipment, Ministry of Education, Dalian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ngib.2014.10.001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jngse.2020.103261"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(87)90011-2"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108843"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.petrol.2019.106581"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.06.050"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109875"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2014.05.012"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2011.2154383"},{"issue":"8","key":"ref10","first-page":"1557","article-title":"Active fault diagnosis for dynamic systems","volume":"46","author":"He","year":"2020","journal-title":"Acta Autom. Sinica"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2020.3015514"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2022.3200214"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3227956"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3202642"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2008.2006100"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2018.09.281"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3240736"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.23919\/ACC.1988.4789837"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/SAFEPROCESS52771.2021.9693676"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2022.02.025"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/S0967-0661(99)00181-1"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S0005-1098(99)00177-6"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2017.2776998"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2016.07.033"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2021.109558"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/en13174475"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3150889"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/electronics11152453"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2013.06.043"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2017.2661762"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.jngse.2015.11.036"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.jngse.2021.104146"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1080\/00207179608921833"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2497201"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.2011.6161111"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2015.09.513"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2020.109029"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10313349.pdf?arnumber=10313349","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T04:31:06Z","timestamp":1705033866000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10313349\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3331394","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}