{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T12:20:33Z","timestamp":1766578833687,"version":"3.37.3"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000190","name":"U.S. Department of Commerce","doi-asserted-by":"publisher","award":["123456"],"award-info":[{"award-number":["123456"]}],"id":[{"id":"10.13039\/100000190","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3331409","type":"journal-article","created":{"date-parts":[[2023,11,8]],"date-time":"2023-11-08T18:55:30Z","timestamp":1699469730000},"page":"1-7","source":"Crossref","is-referenced-by-count":4,"title":["Mechanism Analysis of Thermal-Induced Periodic Fluctuations in Electro-Optic Sensor"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-6566-7320","authenticated-orcid":false,"given":"Yang","family":"Xiao","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4344-3333","authenticated-orcid":false,"given":"Xing","family":"Fan","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8062-642X","authenticated-orcid":false,"given":"Zhehao","family":"Pei","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7923-3656","authenticated-orcid":false,"given":"Weijiang","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Ultrahigh Voltage, State Grid Corporation of China, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3722-8733","authenticated-orcid":false,"given":"Qiaogen","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICICM48536.2019.8977156"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3284921"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2011.5704523"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.1290156"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-577X(99)00171-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2708037"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2013.12.021"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/OL.22.001553"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.1755078"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/22\/12\/125105"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.4949569"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/cp:19990583"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAB.19.002692"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/AO.35.003562"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s00340-006-2414-8"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10313335.pdf?arnumber=10313335","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,19]],"date-time":"2024-11-19T18:40:17Z","timestamp":1732041617000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10313335\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3331409","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}