{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T16:22:31Z","timestamp":1778602951196,"version":"3.51.4"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52005442"],"award-info":[{"award-number":["52005442"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004731","name":"Zhejiang Provincial Natural Science Foundation of China","doi-asserted-by":"publisher","award":["LY22E050014"],"award-info":[{"award-number":["LY22E050014"]}],"id":[{"id":"10.13039\/501100004731","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3331424","type":"journal-article","created":{"date-parts":[[2023,11,16]],"date-time":"2023-11-16T18:56:29Z","timestamp":1700160989000},"page":"1-14","source":"Crossref","is-referenced-by-count":11,"title":["A Novel Composite Envelope Negentropy Deconvolution Reconstruction Method for Fault Diagnosis"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9907-3212","authenticated-orcid":false,"given":"Lei","family":"Fu","sequence":"first","affiliation":[{"name":"College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-2477-8339","authenticated-orcid":false,"given":"Pengshuai","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-1399-2923","authenticated-orcid":false,"given":"Meiya","family":"Ding","sequence":"additional","affiliation":[{"name":"College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1236-1407","authenticated-orcid":false,"given":"Sinian","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9739-6851","authenticated-orcid":false,"given":"Fang","family":"Xu","sequence":"additional","affiliation":[{"name":"College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4784-2283","authenticated-orcid":false,"given":"Zepeng","family":"Ma","sequence":"additional","affiliation":[{"name":"College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3148289"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3085909"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3295476"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3160551"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3046913"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3069381"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3001376"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3016068"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3088481"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/0016-7142(78)90005-4"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.04.049"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2012.06.010"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3159005"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/27\/10\/105004"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.05.036"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2018.06.055"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.02.036"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2844792"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3129492"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108734"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2013.10.007"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.04.034"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.2307\/2372390"},{"key":"ref24","volume-title":"Advanced Calculus: A Transition to Analysis","author":"Dence","year":"2009"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3170973"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107174"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.01.033"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.04.021"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2965634"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10320393.pdf?arnumber=10320393","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T04:19:44Z","timestamp":1705033184000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10320393\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3331424","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}