{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,17]],"date-time":"2026-04-17T16:27:05Z","timestamp":1776443225927,"version":"3.51.2"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["52107160"],"award-info":[{"award-number":["52107160"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["61701327"],"award-info":[{"award-number":["61701327"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["51477106"],"award-info":[{"award-number":["51477106"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["52277156"],"award-info":[{"award-number":["52277156"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2018SCU12003"],"award-info":[{"award-number":["2018SCU12003"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3335527","type":"journal-article","created":{"date-parts":[[2023,11,28]],"date-time":"2023-11-28T19:06:51Z","timestamp":1701198411000},"page":"1-9","source":"Crossref","is-referenced-by-count":19,"title":["A Partial Discharge Signal Separation Method Applicable for Various Sensors Based on Time\u2013Frequency Feature Extraction of t-SNE"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1126-3650","authenticated-orcid":false,"given":"Yao","family":"Fu","sequence":"first","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8109-6408","authenticated-orcid":false,"given":"Kai","family":"Zhou","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3790-4014","authenticated-orcid":false,"given":"Guangya","family":"Zhu","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2639-6034","authenticated-orcid":false,"given":"Zerui","family":"Li","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4579-1833","authenticated-orcid":false,"given":"Yuan","family":"Li","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2359-2822","authenticated-orcid":false,"given":"Pengfei","family":"Meng","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7079-5588","authenticated-orcid":false,"given":"Yefei","family":"Xu","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6077-0977","authenticated-orcid":false,"given":"Lu","family":"Lu","sequence":"additional","affiliation":[{"name":"College of Electronics and Information Engineering, Sichuan University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2002.1038663"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4543121"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2949843"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3216800"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2023.3239032"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2906086"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3197839"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103399"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.004821"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.004822"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2003.1192033"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2005.1430391"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2006.1618967"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2023.3256127"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.7116363"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006758"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006398"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005481"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.005893"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3101301"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2020.009048"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2639678"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.006352"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3121488"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2020.009043"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2918316"},{"key":"ref27","first-page":"2579","article-title":"Visualizing data using t-SNE","volume":"9","author":"van der Maaten","year":"2008","journal-title":"J. Mach. Learn. Res."},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.006940"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICHVE49031.2020.9279994"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/APPEEC.2010.5449349"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2011.2124474"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3162292"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3054024"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10330705.pdf?arnumber=10330705","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T01:34:01Z","timestamp":1705023241000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10330705\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3335527","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}