{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T16:01:01Z","timestamp":1780502461182,"version":"3.54.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000038","name":"Natural Science and Engineering Research Council of Canada","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000038","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3336447","type":"journal-article","created":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T22:39:33Z","timestamp":1701470373000},"page":"1-12","source":"Crossref","is-referenced-by-count":3,"title":["Multidimensional Time-Series Shapelet-Based Real-Time Fault Detection and Localization on ISS Electrical Power Distribution System"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0836-4469","authenticated-orcid":false,"given":"Qin","family":"Liu","sequence":"first","affiliation":[{"name":"School of Mechanical, Electronic and Control Engineering, Beijing Jiaotong University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3084-1500","authenticated-orcid":false,"given":"Weiran","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Alberta, Edmonton, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7438-9547","authenticated-orcid":false,"given":"Venkata","family":"Dinavahi","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Alberta, Edmonton, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","author":"Dempsey","year":"2018","journal-title":"The International Space Station: Operating an Outpost in the New Frontier"},{"key":"ref2","volume-title":"Reference Guide to the International Space Station","year":"2010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2003.1238750"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2018.9102"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1748-0221\/1\/12\/T12001"},{"key":"ref6","volume-title":"Critical Space Station Spacewalk a Success","author":"Boucher","year":"2012"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2013.6494407"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.806016"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2020.9200875"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2721903"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2977116"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3126006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3265741"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2950918"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2017.2776310"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/EEEIC\/ICPSEurope49358.2020.9160759"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CPE.2018.8372503"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1557019.1557122"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2824902"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3151169"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611972832.74"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.comnet.2020.107171"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/2623330.2623613"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DSAA.2015.7344782"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3233\/IDA-173717"},{"key":"ref26","article-title":"Correlation-based feature selection for machine learning","author":"Hall","year":"1998"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/9781119819035"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.2514\/6.2014-3835"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/OJPEL.2022.3160416"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/WAC.2006.376045"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/8712960"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/IECEC.1997.658217"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3077675"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2015.2397599"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/7.303749"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1186\/s41747-020-0145-y"},{"key":"ref37","volume-title":"VCU118 Evaluation Board User Guide","year":"2018"},{"key":"ref38","volume-title":"VCU128 Evaluation Board User Guide","year":"2018"},{"key":"ref39","volume-title":"Aurora 64B\/66B LogiCORE IP Product Guide, PG074(V11.2)","year":"2017"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10334502.pdf?arnumber=10334502","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T03:05:13Z","timestamp":1705028713000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10334502\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3336447","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}