{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:09:32Z","timestamp":1740132572976,"version":"3.37.3"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Doctoral Scientific Research Fund","award":["EA202208183"],"award-info":[{"award-number":["EA202208183"]}]},{"name":"Key Laboratory of Nondestructive Testing (Nanchang Hangkong University) Open Fund","award":["EW202208366","EW202280375"],"award-info":[{"award-number":["EW202208366","EW202280375"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51875226"],"award-info":[{"award-number":["51875226"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3338672","type":"journal-article","created":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T18:20:56Z","timestamp":1701454856000},"page":"1-11","source":"Crossref","is-referenced-by-count":0,"title":["A Novel Leakage Magnetic Field Enhancement Method Based on Permeability Perturbation"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5339-1522","authenticated-orcid":false,"given":"Rongbiao","family":"Wang","sequence":"first","affiliation":[{"name":"Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9658-209X","authenticated-orcid":false,"given":"Jian","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3305-7904","authenticated-orcid":false,"given":"Haozhi","family":"Yu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1057-3932","authenticated-orcid":false,"given":"Bo","family":"Feng","sequence":"additional","affiliation":[{"name":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2622-4769","authenticated-orcid":false,"given":"Yihua","family":"Kang","sequence":"additional","affiliation":[{"name":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3169-7157","authenticated-orcid":false,"given":"Kai","family":"Song","sequence":"additional","affiliation":[{"name":"Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/tie.2023.3250747"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.ndteint.2023.102786"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/tim.2023.3267346"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/jsen.2021.3076880"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/jsen.2022.3190684"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/tim.2021.3058407"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1364\/ao.386499"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1784\/insi.2012.54.9.493"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1016\/j.ndteint.2022.102737"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/tie.2023.3239857"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.ndteint.2019.01.004"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/tmag.2018.2809671"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/j.sna.2017.08.009"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/tmag.2017.2713042"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/j.sna.2010.03.038"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/j.ndteint.2010.01.005"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/tim.2023.3251393"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1007\/s10921-023-00941-1"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1007\/s10921-018-0499-8"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/tmag.2015.2427272"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1007\/s10921-017-0396-6"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/jsen.2016.2567458"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/tmag.2017.2713880"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/tim.2022.3149102"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1016\/j.ndteint.2022.102781"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1016\/j.jmmm.2022.169888"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1016\/j.ndteint.2022.102706"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1016\/j.sna.2021.113091"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1109\/tim.2021.3085946"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1016\/j.ndteint.2018.08.006"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1088\/0022-3727\/19\/4\/018"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10339367.pdf?arnumber=10339367","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T01:27:21Z","timestamp":1705022841000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10339367\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3338672","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}