{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,10]],"date-time":"2026-06-10T10:30:12Z","timestamp":1781087412646,"version":"3.54.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62325302"],"award-info":[{"award-number":["62325302"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005230","name":"Natural Science Foundation of Chongqing, China","doi-asserted-by":"publisher","award":["cstc2020jcyjzdxmX0014"],"award-info":[{"award-number":["cstc2020jcyjzdxmX0014"]}],"id":[{"id":"10.13039\/501100005230","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2023M730405"],"award-info":[{"award-number":["2023M730405"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3338680","type":"journal-article","created":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T18:20:56Z","timestamp":1701454856000},"page":"1-10","source":"Crossref","is-referenced-by-count":23,"title":["Compound Fault Diagnosis of Rotating Machine Through Label Correlation Modeling via Graph Convolutional Neural Network"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9830-3955","authenticated-orcid":false,"given":"Huayan","family":"Pu","sequence":"first","affiliation":[{"name":"College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-8277-585X","authenticated-orcid":false,"given":"Shouwei","family":"Teng","sequence":"additional","affiliation":[{"name":"College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2363-6867","authenticated-orcid":false,"given":"Dengyu","family":"Xiao","sequence":"additional","affiliation":[{"name":"College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4370-3385","authenticated-orcid":false,"given":"Lang","family":"Xu","sequence":"additional","affiliation":[{"name":"College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2160-4300","authenticated-orcid":false,"given":"Yi","family":"Qin","sequence":"additional","affiliation":[{"name":"College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4475-2338","authenticated-orcid":false,"given":"Jun","family":"Luo","sequence":"additional","affiliation":[{"name":"College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2992692"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2020.106396"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2019.105313"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110427"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108500"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.02.071"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.106587"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109884"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2928346"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109319"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106625"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108774"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2925247"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3012182"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3034189"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3159005"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8827030"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2019.103132"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.106796"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108036"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.119642"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2958010"},{"key":"ref23","article-title":"Semi-supervised classification with graph convolutional networks","author":"Kipf","year":"2016","journal-title":"arXiv:1609.02907"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00532"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58589-1_39"},{"key":"ref26","first-page":"1","article-title":"Attention is all you need","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Vaswani"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.15439\/2020F20"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-19266-y"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2022.3227717"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2022.3168465"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2018.12.001"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/s17020425"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2018.12.016"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2886343"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3176280"},{"issue":"11","key":"ref36","first-page":"1","article-title":"Visualizing data using t-SNE","volume":"9","author":"Van der Maaten","year":"2008","journal-title":"J. Mach. Learn. Res."}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10339377.pdf?arnumber=10339377","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T02:40:17Z","timestamp":1705027217000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10339377\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3338680","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}