{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T17:43:39Z","timestamp":1777657419660,"version":"3.51.4"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001691","name":"JSPS KAKENHI","doi-asserted-by":"publisher","award":["JP22K04059"],"award-info":[{"award-number":["JP22K04059"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2023.3343812","type":"journal-article","created":{"date-parts":[[2023,12,18]],"date-time":"2023-12-18T19:29:38Z","timestamp":1702927778000},"page":"1-7","source":"Crossref","is-referenced-by-count":3,"title":["A Flexible Evaluation System for the Complex Calibration of Inductive and Resistive Voltage Dividers up to 100 kHz"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3590-9663","authenticated-orcid":false,"given":"Tatsuji","family":"Yamada","sequence":"first","affiliation":[{"name":"National Metrology Institute of Japan, Tsukuba, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9823-5729","authenticated-orcid":false,"given":"Hidekazu","family":"Muramatsu","sequence":"additional","affiliation":[{"name":"National Metrology Institute of Japan, Tsukuba, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0102-7198","authenticated-orcid":false,"given":"Norihiko","family":"Sakamoto","sequence":"additional","affiliation":[{"name":"National Metrology Institute of Japan, Tsukuba, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0206-2080","authenticated-orcid":false,"given":"Katsuya","family":"Tachibana","sequence":"additional","affiliation":[{"name":"Yokogawa Electric Corporation, Kofu, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9369-9804","authenticated-orcid":false,"given":"Toshiaki","family":"Shioda","sequence":"additional","affiliation":[{"name":"Yokogawa Test and Measurement Corporation, Hachioji, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/s17112657"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2653519"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/733\/1\/012072"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/19.650772"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3047956"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2668758"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540805"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540741"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2784998"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2890746"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2014.6985257"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008469"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0950-7671\/31\/12\/307"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1972.4314001"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.870120"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3014034"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/cpem49742.2020.9191795"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8501056"},{"key":"ref19","first-page":"123","article-title":"A concept of a wideband RVD calibration method by a combination buildup of measurements and simulations","volume-title":"Proc. Conf. Prec. Electr. Meas. (CPEM)","author":"Yamada"},{"key":"ref20","volume-title":"Report on the Bootstrapped Buffer for QuADC EMPIR","author":"Ma\u0161l\u00e1\u0148","year":"2017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8501232"},{"issue":"1","key":"ref22","first-page":"45","article-title":"Calibration and uncertainty estimation of a two-staged inductive voltage divider","volume":"4","author":"Nakamura","year":"2005","journal-title":"AIST Bull. Metrol."},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2008.4574790"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10363375.pdf?arnumber=10363375","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T20:10:44Z","timestamp":1705090244000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10363375\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/tim.2023.3343812","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}