{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,16]],"date-time":"2026-06-16T09:45:27Z","timestamp":1781603127207,"version":"3.54.5"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001381","name":"Singapore Power Group and the National Research Foundation, Singapore","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001381","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Energy Market Authority under its Energy Program","award":["EP Award EMA-EP010-SNJL-004"],"award-info":[{"award-number":["EP Award EMA-EP010-SNJL-004"]}]},{"DOI":"10.13039\/501100001475","name":"Nanyang Technological University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001475","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3351239","type":"journal-article","created":{"date-parts":[[2024,1,8]],"date-time":"2024-01-08T19:36:45Z","timestamp":1704742605000},"page":"1-11","source":"Crossref","is-referenced-by-count":25,"title":["Edge-Computing-Based Knowledge Distillation and Multitask Learning for Partial Discharge Recognition"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5360-919X","authenticated-orcid":false,"given":"Jinsheng","family":"Ji","sequence":"first","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0976-1263","authenticated-orcid":false,"given":"Zhou","family":"Shu","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, National University of Singapore, Queenstown, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6793-4364","authenticated-orcid":false,"given":"Hongqun","family":"Li","sequence":"additional","affiliation":[{"name":"Grid Digitalisation and Corporate Support, Singapore Power Group, Bras Basah, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-5320-6682","authenticated-orcid":false,"given":"Kai Xian","family":"Lai","sequence":"additional","affiliation":[{"name":"Grid Digitalisation and Corporate Support, Singapore Power Group, Bras Basah, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2448-0067","authenticated-orcid":false,"given":"Minshan","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5597-3721","authenticated-orcid":false,"given":"Guanlin","family":"Jiang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5773-8335","authenticated-orcid":false,"given":"Wensong","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5768-367X","authenticated-orcid":false,"given":"Yuanjin","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9104-2315","authenticated-orcid":false,"given":"Xudong","family":"Jiang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2908580"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3269120"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/en13205496"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3121488"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2022.3148461"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3205653"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-023-01808-4"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/en14133886"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109220"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/en15020508"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2022.3168328"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3236315"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/smt2.12137"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2023.3275548"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/EIC55835.2023.10177318"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICCRE57112.2023.10155616"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2019.2921977"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v37i2.25304"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3115815"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2020.3041332"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1117\/12.2518469"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2017.2745818"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2946662"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2019.0542"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3268763"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1503.02531"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2022.3200344"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2022.01.030"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP43922.2022.9747908"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2022.3224597"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/e24070954"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6579\/acdfb5"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00140"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10384445.pdf?arnumber=10384445","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,16]],"date-time":"2025-06-16T18:57:34Z","timestamp":1750100254000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10384445\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3351239","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}