{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,8]],"date-time":"2026-07-08T16:15:32Z","timestamp":1783527332854,"version":"3.55.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["6207020955"],"award-info":[{"award-number":["6207020955"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFB4702800"],"award-info":[{"award-number":["2022YFB4702800"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004735","name":"Natural Science Foundation of Hunan Province","doi-asserted-by":"publisher","award":["2022JJ30011"],"award-info":[{"award-number":["2022JJ30011"]}],"id":[{"id":"10.13039\/501100004735","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3351252","type":"journal-article","created":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T20:19:32Z","timestamp":1704831572000},"page":"1-12","source":"Crossref","is-referenced-by-count":16,"title":["An Adaptive Multiexposure Scheme for the Structured Light Profilometry of Highly Reflective Surfaces Using Complementary Binary Gray Code"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6029-2111","authenticated-orcid":false,"given":"Tianle","family":"Cheng","sequence":"first","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4668-5362","authenticated-orcid":false,"given":"Long","family":"Qin","sequence":"additional","affiliation":[{"name":"CRRC ZhuZhou Institute Company Ltd., Zhuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-6728-1663","authenticated-orcid":false,"given":"Yulong","family":"Li","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-2785-4587","authenticated-orcid":false,"given":"Jialong","family":"Hou","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4864-5444","authenticated-orcid":false,"given":"Changyan","family":"Xiao","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2881948"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/abddf2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3027317"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2014.03.003"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.010064"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/OE.398814"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1117\/12.364255"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2991458"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1117\/12.629942"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aab07a"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aae4fb"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s11831-021-09540-7"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.4018\/978-1-5225-2848-7.ch002"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.4018\/978-1-5225-2848-7.ch011"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.15662\/ijareeie.2015.0410023"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/12.791265"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.56.3.031208"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISOT.2010.5687390"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2010.03.004"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.04.010"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.007337"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2017.03.008"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1117\/12.410877"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2188875"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-8659.2008.01171.x"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2011.11.021"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvcir.2017.12.003"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2020.106029"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-014-6360-z"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2003.10.002"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/34.888718"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10385054.pdf?arnumber=10385054","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,14]],"date-time":"2024-02-14T18:39:26Z","timestamp":1707935966000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10385054\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3351252","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}