{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,17]],"date-time":"2026-06-17T16:32:52Z","timestamp":1781713972975,"version":"3.54.5"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["62071149"],"award-info":[{"award-number":["62071149"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61671177"],"award-info":[{"award-number":["61671177"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"name":"National Key Research and Development Program of China","award":["2022YFB3304000"],"award-info":[{"award-number":["2022YFB3304000"]}]},{"name":"Postdoctoral Fellowship Program of CPSF","award":["GZB20240968"],"award-info":[{"award-number":["GZB20240968"]}]},{"DOI":"10.13039\/501100001809","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3353282","type":"journal-article","created":{"date-parts":[[2024,1,19]],"date-time":"2024-01-19T18:41:48Z","timestamp":1705689708000},"page":"1-9","source":"Crossref","is-referenced-by-count":9,"title":["Time-Based Finite-Rate-of-Innovation Sampling for Variable-Pulse-Width Signal"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0317-9697","authenticated-orcid":false,"given":"Ning","family":"Fu","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology (HIT), Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7575-8671","authenticated-orcid":false,"given":"Hongyi","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology (HIT), Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1256-6442","authenticated-orcid":false,"given":"Shuangxing","family":"Yun","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology (HIT), Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2549-4783","authenticated-orcid":false,"given":"Zhiliang","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology (HIT), Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7397-3458","authenticated-orcid":false,"given":"Liyan","family":"Qiao","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology (HIT), Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/5.843002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2977742"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2002.1003065"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3144213"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC48687.2022.9806697"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2015.7179115"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2669900"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3164921"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.835026"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-spr.2014.0170"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2019.2961301"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/Eusipco47968.2020.9287806"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP40776.2020.9053120"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2022.3167146"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP43922.2022.9746159"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2016.7520485"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2014.120475"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/ell2.12302"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2895438"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cds.2010.0147"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC53148.2023.10176047"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICSPCC.2012.6335674"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2278152"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914998"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s10440-009-9474-9"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2011.2105481"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2005.850321"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10410249.pdf?arnumber=10410249","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,21]],"date-time":"2024-07-21T04:09:17Z","timestamp":1721534957000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10410249\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3353282","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}