{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,5]],"date-time":"2026-05-05T12:28:53Z","timestamp":1777984133750,"version":"3.51.4"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62103381"],"award-info":[{"award-number":["62103381"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12204434"],"award-info":[{"award-number":["12204434"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004731","name":"Zhejiang Provincial Natural Science Foundation of China","doi-asserted-by":"publisher","award":["LQ21F030005"],"award-info":[{"award-number":["LQ21F030005"]}],"id":[{"id":"10.13039\/501100004731","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Center-Initiated Research Project of Zhejiang Laboratory","award":["2022MB0AL01"],"award-info":[{"award-number":["2022MB0AL01"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3353834","type":"journal-article","created":{"date-parts":[[2024,1,15]],"date-time":"2024-01-15T16:04:58Z","timestamp":1705334698000},"page":"1-8","source":"Crossref","is-referenced-by-count":5,"title":["Coupling of Magnetic Field Noise in Multilayer Magnetic Shields for Atomic Magnetometer"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2922-799X","authenticated-orcid":false,"given":"Zixuan","family":"Wang","sequence":"first","affiliation":[{"name":"Research Center for Quantum Sensing, Research Institute of Intelligent Sensing, Zhejiang Laboratory, Hangzhou, Zhejiang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-3965-724X","authenticated-orcid":false,"given":"Mengshi","family":"Zhang","sequence":"additional","affiliation":[{"name":"Zhejiang Laboratory, Zhejiang, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4508-0641","authenticated-orcid":false,"given":"Ke","family":"Yang","sequence":"additional","affiliation":[{"name":"Xi’an Modern Control Technology Research Institute, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-9522-7661","authenticated-orcid":false,"given":"Tingting","family":"Yu","sequence":"additional","affiliation":[{"name":"Zhejiang Laboratory, Zhejiang, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5376-0770","authenticated-orcid":false,"given":"Bihu","family":"Lv","sequence":"additional","affiliation":[{"name":"Zhejiang Laboratory, Zhejiang, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3169-9577","authenticated-orcid":false,"given":"Yao","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Technology, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1659-2907","authenticated-orcid":false,"given":"Ning","family":"Zhang","sequence":"additional","affiliation":[{"name":"Zhejiang Laboratory, Zhejiang, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-2137-5480","authenticated-orcid":false,"given":"Jia","family":"Guo","sequence":"additional","affiliation":[{"name":"Zhejiang Laboratory, Zhejiang, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3156-8160","authenticated-orcid":false,"given":"Dezhao","family":"Li","sequence":"additional","affiliation":[{"name":"Zhejiang Provincial Key Laboratory of Quantum Precision Measurement, College of Science, Zhejiang University of Technology, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4837-2586","authenticated-orcid":false,"given":"Xiaolong","family":"Wang","sequence":"additional","affiliation":[{"name":"Zhejiang Provincial Key Laboratory of Quantum Precision Measurement, College of Science, Zhejiang University of Technology, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nature01484"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.3491215"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3156814"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-022-34924-z"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.4919366"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/5.0087311"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/5.0156686"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ac2b67"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3066929"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3159961"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.80.033420"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.2737357"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpcs.2018.08.007"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/OME.2.000978"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2011.09.009"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2199469"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3050351"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ceramint.2022.12.045"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2021.168324"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.1982.1061780"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/20\/9\/001"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/0168-9002(86)90989-7"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.mseb.2007.06.005"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ceramint.2016.03.005"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.2885711"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113419"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/abf169"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10399937.pdf?arnumber=10399937","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:21:32Z","timestamp":1725150092000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10399937\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3353834","relation":{"has-preprint":[{"id-type":"doi","id":"10.36227\/techrxiv.23751477.v1","asserted-by":"object"}]},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}