{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T18:01:35Z","timestamp":1775325695727,"version":"3.50.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program","doi-asserted-by":"publisher","award":["2022YFE0113700"],"award-info":[{"award-number":["2022YFE0113700"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52130505"],"award-info":[{"award-number":["52130505"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52205044"],"award-info":[{"award-number":["52205044"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004750","name":"Aeronautical Science Foundation of China","doi-asserted-by":"publisher","award":["20200007051002"],"award-info":[{"award-number":["20200007051002"]}],"id":[{"id":"10.13039\/501100004750","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Ningbo Key Scientific and Technological Project","award":["2022Z040"],"award-info":[{"award-number":["2022Z040"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3353876","type":"journal-article","created":{"date-parts":[[2024,1,19]],"date-time":"2024-01-19T18:41:48Z","timestamp":1705689708000},"page":"1-11","source":"Crossref","is-referenced-by-count":9,"title":["Modeling and Analysis of Short-Circuit Current for a Novel Dual Three-Phase Electric Machine With Mixed Iron-Pole Halbach Magnet Pattern"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-2843-8076","authenticated-orcid":false,"given":"Jin","family":"Wang","sequence":"first","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9099-240X","authenticated-orcid":false,"given":"Liang","family":"Yan","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering and the Science and Technology on Aircraft Control Laboratory, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-8071-8620","authenticated-orcid":false,"given":"Hang","family":"Su","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2057-3386","authenticated-orcid":false,"given":"Xiaoshan","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0492-2099","authenticated-orcid":false,"given":"Ziwei","family":"Dong","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4831-3781","authenticated-orcid":false,"given":"I-Ming","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Mechanical and Aerospace Engineering, Nanyang Technological University, Jurong West, Singapore"}]}],"member":"263","reference":[{"key":"ref1","article-title":"Developmental testing of electric thrust vector control systems for manned launch vehicle applications","author":"Bates","year":"2012"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3127641"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/s21196464"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1177\/0954406217749869"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2866338"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2090930"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3059546"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2748035"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3013128"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3285999"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2020.2987637"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2311494"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.cja.2017.05.001"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/60.815095"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/28.511646"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2809463"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2454483"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2878131"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2833023"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3116558"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2902729"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2017.2743246"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2600649"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE44975.2020.9235704"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2004.832074"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2006.880869"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3196115"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2015.09.014"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2941146"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2955407"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2003.820537"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3279339"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10404070.pdf?arnumber=10404070","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,10]],"date-time":"2024-04-10T18:13:00Z","timestamp":1712772780000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10404070\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3353876","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}