{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,24]],"date-time":"2026-06-24T11:42:14Z","timestamp":1782301334213,"version":"3.54.5"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Research and Development Project of State Grid Corporation of China","award":["5700-202326279A-1-1-ZN"],"award-info":[{"award-number":["5700-202326279A-1-1-ZN"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3364262","type":"journal-article","created":{"date-parts":[[2024,2,9]],"date-time":"2024-02-09T18:29:01Z","timestamp":1707503341000},"page":"1-12","source":"Crossref","is-referenced-by-count":26,"title":["Non-Contact Voltage Reconstruction Method Based on Dual-Pin Type Probes Structure and Measuring Point Optimization for AC Overhead Transmission Lines"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8400-4508","authenticated-orcid":false,"given":"Yankai","family":"Xing","sequence":"first","affiliation":[{"name":"Power System Wide-Area Measurement and Control Sichuan Province Key Laboratory, School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Sichuan, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-1355-395X","authenticated-orcid":false,"given":"Jinpu","family":"Liu","sequence":"additional","affiliation":[{"name":"Power System Wide-Area Measurement and Control Sichuan Province Key Laboratory, School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Sichuan, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2330-9054","authenticated-orcid":false,"given":"Fuchao","family":"Li","sequence":"additional","affiliation":[{"name":"Power System Wide-Area Measurement and Control Sichuan Province Key Laboratory, School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Sichuan, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4267-9811","authenticated-orcid":false,"given":"Guangdou","family":"Zhang","sequence":"additional","affiliation":[{"name":"Power System Wide-Area Measurement and Control Sichuan Province Key Laboratory, School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Sichuan, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3007-1443","authenticated-orcid":false,"given":"Jian","family":"Li","sequence":"additional","affiliation":[{"name":"Power System Wide-Area Measurement and Control Sichuan Province Key Laboratory, School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Sichuan, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2011.5704523"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3096272"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2011.01.015"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2030928"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/s16010040"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2014.2363294"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12081858"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/5.0052678"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/mi13040619"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2017.2693272"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2017.2692726"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2636862"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.1849"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2983576"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3159006"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3157907"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3315402"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CEC.2003.1299579"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-0661-3"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CEC.1999.785514"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10431716.pdf?arnumber=10431716","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T17:52:07Z","timestamp":1710438727000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10431716\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3364262","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}