{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,27]],"date-time":"2026-05-27T18:13:53Z","timestamp":1779905633426,"version":"3.53.1"},"reference-count":50,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2021YFB3301503"],"award-info":[{"award-number":["2021YFB3301503"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62376026"],"award-info":[{"award-number":["62376026"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005090","name":"Beijing Nova Program","doi-asserted-by":"publisher","award":["20230484296"],"award-info":[{"award-number":["20230484296"]}],"id":[{"id":"10.13039\/501100005090","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3366268","type":"journal-article","created":{"date-parts":[[2024,2,15]],"date-time":"2024-02-15T18:48:50Z","timestamp":1708022930000},"page":"1-12","source":"Crossref","is-referenced-by-count":7,"title":["Principal Properties Attention Matching for Partial Domain Adaptation in Fault Diagnosis"],"prefix":"10.1109","volume":"73","author":[{"given":"Shugang","family":"Li","sequence":"first","affiliation":[{"name":"School of Computer Science and Technology, Beijing Institute of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-7642-0806","authenticated-orcid":false,"given":"Renhu","family":"Bu","sequence":"additional","affiliation":[{"name":"School of Computer Science and Technology, Beijing Institute of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1910-7812","authenticated-orcid":false,"given":"Shuang","family":"Li","sequence":"additional","affiliation":[{"name":"School of Computer Science and Technology, Beijing Institute of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0252-329X","authenticated-orcid":false,"given":"Chi Harold","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Computer Science and Technology, Beijing Institute of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3553-3424","authenticated-orcid":false,"given":"Keke","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Automation, Central South University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3218737"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3050173"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3054651"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110208"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2023.08.042"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1080\/10942912.2023.2218066"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107327"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2754287"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3178488"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3196948"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3318679"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3276027"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984968"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3129213"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2956294"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3076704"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3214490"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2994621"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2020.07.088"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3150589"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3196742"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3102017"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3265095"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3119002"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3152305"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1080\/00207217.2021.1941295"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3529509"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3025396"},{"key":"ref29","first-page":"1","article-title":"Deep transfer learning for bearing fault diagnosis","volume":"72","author":"Chen","year":"2023","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3180416"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3301901"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3141783"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3149934"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3064377"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3078712"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3133938"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2950667"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3224988"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3008010"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2927590"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.463"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2020.2964173"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01237-3_9"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.04.021"},{"key":"ref45","first-page":"5","article-title":"Condition monitoring of bearing damage in electromechanical drive systems by using motor current signals of electric motors: A benchmark data set for data-driven classification","volume-title":"Proc. Euro. Conf. Prognostics Health Manage. Soc.","author":"Lessmeier"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3045002"},{"key":"ref47","first-page":"97","article-title":"Learning transferable features with deep adaptation networks","volume-title":"Proc. 32nd Int. Conf. Mach. Learn.","volume":"37","author":"Long"},{"key":"ref48","first-page":"1180","article-title":"Unsupervised domain adaptation by back-propagation","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Ganin"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3297513"},{"issue":"85","key":"ref50","first-page":"2579","article-title":"Visualizing data using t-SNE","volume":"9","author":"van der Maaten","year":"2008","journal-title":"J. Mach. Learn. Res."}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10436666.pdf?arnumber=10436666","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T09:47:34Z","timestamp":1710409654000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10436666\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":50,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3366268","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}