{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,25]],"date-time":"2025-11-25T06:58:13Z","timestamp":1764053893209,"version":"3.37.3"},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52130504"],"award-info":[{"award-number":["52130504"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Key Research and Development Program of Hubei Province","award":["2021BAA013"],"award-info":[{"award-number":["2021BAA013"]}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2021XXJS113"],"award-info":[{"award-number":["2021XXJS113"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100021171","name":"Basic and Applied Basic Research Foundation of Guangdong Province","doi-asserted-by":"publisher","award":["2023A1515030149"],"award-info":[{"award-number":["2023A1515030149"]}],"id":[{"id":"10.13039\/501100021171","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Innovation Project of Optics Valley Laboratory","award":["OVL2023PY003"],"award-info":[{"award-number":["OVL2023PY003"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3372223","type":"journal-article","created":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T18:36:34Z","timestamp":1709318194000},"page":"1-12","source":"Crossref","is-referenced-by-count":7,"title":["An Efficient and Robust Self-Calibration Algorithm for Translation Position Errors in Ptychography"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-2512-882X","authenticated-orcid":false,"given":"Li","family":"Liu","sequence":"first","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-3630-6392","authenticated-orcid":false,"given":"Lei","family":"Zhong","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-4592-0649","authenticated-orcid":false,"given":"Ming","family":"Gong","sequence":"additional","affiliation":[{"name":"School of Optical and Electronic Information and the Innovation Institute, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-6727-0477","authenticated-orcid":false,"given":"Jinxiang","family":"Du","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8812-1621","authenticated-orcid":false,"given":"Honggang","family":"Gu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0756-1439","authenticated-orcid":false,"given":"Shiyuan","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.112418"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110172"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/OL.43.000543"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/s41566-017-0072-5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1126\/science.abg2533"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.001452"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1364\/OE.16.007264"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2018.04.004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2023.113716"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.028053"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2019.07.046"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2012.11.006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2012.06.001"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/BOE.7.001336"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/BOE.7.004543"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1364\/OE.26.023661"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.3600235"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/OE.506376"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1364\/OE.398951"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/BOE.456380"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1364\/BOE.467622"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/OE.21.013592"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110222"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.000938"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2022.106978"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1364\/OL.400008"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1364\/OL.33.000156"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-00069-1_17"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-12388-2"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3363788"},{"key":"ref31","article-title":"Adam: A method for stochastic optimization","author":"Kingma","year":"2014","journal-title":"arXiv:1412.6980"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2022.107136"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.4.000736"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1021\/acsphotonics.2c01527"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2013.187"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1088\/978-1-6817-4273-1"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-019-11024-z"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1038\/s41377-023-01321-0"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109067"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113055"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2023.107748"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1364\/OL.389492"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1364\/OL.453655"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10456934.pdf?arnumber=10456934","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,30]],"date-time":"2024-08-30T17:40:23Z","timestamp":1725039623000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10456934\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":43,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3372223","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}