{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T13:28:03Z","timestamp":1751894883328,"version":"3.40.3"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["1082204112E78"],"award-info":[{"award-number":["1082204112E78"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2021YFB3201204"],"award-info":[{"award-number":["2021YFB3201204"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3374289","type":"journal-article","created":{"date-parts":[[2024,3,27]],"date-time":"2024-03-27T18:53:59Z","timestamp":1711565639000},"page":"1-10","source":"Crossref","is-referenced-by-count":2,"title":["Single-Input and Single-Output Detection of Multiple Trace Substances via High-Order Nonlinear Mode Localization"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-8779-006X","authenticated-orcid":false,"given":"Gang","family":"Xiao","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu, Sichuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3626-6890","authenticated-orcid":false,"given":"Wei","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu, Sichuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-1147-8623","authenticated-orcid":false,"given":"Haiyang","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu, Sichuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-0117-7885","authenticated-orcid":false,"given":"Lijia","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu, Sichuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4667-5682","authenticated-orcid":false,"given":"Zhujie","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu, Sichuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-4330-2160","authenticated-orcid":false,"given":"Jie","family":"Song","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Jiangsu University, Zhenjiang, Jiangsu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5799-0648","authenticated-orcid":false,"given":"Yuanlin","family":"Xia","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu, Sichuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2819-7709","authenticated-orcid":false,"given":"Cao","family":"Xia","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu, Sichuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7513-5773","authenticated-orcid":false,"given":"Zhuqing","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu, Sichuan, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1021\/ac101948u"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/0925-4005(93)01049-a"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2012.263"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2012.04.003"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2012.05.007"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2004.01.024"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2011.10.054"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.113896"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.1650542"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2006.07.071"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2006.208"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2009.152"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2012.42"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106784"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3134464"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.107886"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.107887"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-017-01147-y"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-019-11647-2"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.1948521"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.2804074"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.3473761"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108395"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/1.2899634"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2878695"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/1.2964192"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1063\/1.5003023"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1063\/5.0007446"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.107781"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.06.004"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10479146.pdf?arnumber=10479146","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T07:16:59Z","timestamp":1742973419000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10479146\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3374289","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}