{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,13]],"date-time":"2026-05-13T17:21:36Z","timestamp":1778692896349,"version":"3.51.4"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52075353"],"award-info":[{"award-number":["52075353"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52205119"],"award-info":[{"award-number":["52205119"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52275121"],"award-info":[{"award-number":["52275121"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3375405","type":"journal-article","created":{"date-parts":[[2024,3,27]],"date-time":"2024-03-27T18:54:08Z","timestamp":1711565648000},"page":"1-9","source":"Crossref","is-referenced-by-count":9,"title":["Sparse Optimization Model Based on Sparse Matrix and Singular Value Vector for Fault Diagnosis of Rolling Bearings"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-0409-0387","authenticated-orcid":false,"given":"Tianxu","family":"Qiu","sequence":"first","affiliation":[{"name":"School of Rail Transportation, Soochow University, Suzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6734-2019","authenticated-orcid":false,"given":"Weiguo","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Rail Transportation, Soochow University, Suzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1550-6058","authenticated-orcid":false,"given":"Yi","family":"Liao","sequence":"additional","affiliation":[{"name":"School of Rail Transportation, Soochow University, Suzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7610-5293","authenticated-orcid":false,"given":"Chuancang","family":"Ding","sequence":"additional","affiliation":[{"name":"School of Rail Transportation, Soochow University, Suzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3392-1020","authenticated-orcid":false,"given":"Jun","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Rail Transportation, Soochow University, Suzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.06.007"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.04.039"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3076569"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113177"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3186706"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109832"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3225008"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3016068"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106683"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2905043"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3039648"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2793271"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108576"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2023.08.028"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3176244"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106790"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109602"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2021.3058590"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2021.107907"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2018.2799862"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2019.2895331"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2771471"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2511584"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2017.04.011"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2020.01.037"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3135284"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2751878"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3170973"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2711501"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2016.2535227"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3269103"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2005.03.007"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10482910.pdf?arnumber=10482910","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,2]],"date-time":"2024-04-02T04:42:25Z","timestamp":1712032945000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10482910\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3375405","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}