{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,22]],"date-time":"2025-11-22T11:36:13Z","timestamp":1763811373122,"version":"3.37.3"},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3375969","type":"journal-article","created":{"date-parts":[[2024,3,11]],"date-time":"2024-03-11T18:03:58Z","timestamp":1710180238000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["A Linear Instrument for In Situ Stack-Level Fuel Cell Characterization Using Periodical EIS Perturbations"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9587-8419","authenticated-orcid":false,"given":"Jiabin","family":"Shen","sequence":"first","affiliation":[{"name":"General Motors Canada Company, Oshawa, ON, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9395-7252","authenticated-orcid":false,"given":"Jiacheng","family":"Wang","sequence":"additional","affiliation":[{"name":"Mechatronic Systems Engineering of Simon Fraser University, Surrey, BC, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2005.11.035"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2007.05.036"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2020.3042990"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2018.2806090"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2318371"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2434093"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2406051"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2019.03.130"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3016250"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2028295"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10466710.pdf?arnumber=10466710","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T15:16:21Z","timestamp":1711984581000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10466710\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3375969","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}