{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,9]],"date-time":"2026-05-09T16:54:14Z","timestamp":1778345654708,"version":"3.51.4"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U22B20115"],"award-info":[{"award-number":["U22B20115"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3378268","type":"journal-article","created":{"date-parts":[[2024,3,18]],"date-time":"2024-03-18T18:59:16Z","timestamp":1710788356000},"page":"1-12","source":"Crossref","is-referenced-by-count":8,"title":["An Online Fault Detection and Remaining Life Prediction Method Based on SVDD for Rolling Bearings"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-6871-6792","authenticated-orcid":false,"given":"Aiyun","family":"Yan","sequence":"first","affiliation":[{"name":"Information Science and Engineering College, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-2967-1367","authenticated-orcid":false,"given":"Yuhang","family":"Zhao","sequence":"additional","affiliation":[{"name":"Information Science and Engineering College, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-1846-5243","authenticated-orcid":false,"given":"Zhenlin","family":"Lu","sequence":"additional","affiliation":[{"name":"Intelligent Systems Department, Beijing Microelectronics Technology Institute (BMTI), Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9342-9700","authenticated-orcid":false,"given":"Yongheng","family":"Pang","sequence":"additional","affiliation":[{"name":"Public Security Information Technology and Intelligence College, China Criminal Police Academy, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9679-3698","authenticated-orcid":false,"given":"Shuowei","family":"Jin","sequence":"additional","affiliation":[{"name":"Information Science and Engineering College, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-7768-4232","authenticated-orcid":false,"given":"Zhiliang","family":"Liu","sequence":"additional","affiliation":[{"name":"Intelligent Systems Department, Beijing Microelectronics Technology Institute (BMTI), Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-9537-7968","authenticated-orcid":false,"given":"Hongchao","family":"Xu","sequence":"additional","affiliation":[{"name":"Information Science and Engineering College, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-0703-6990","authenticated-orcid":false,"given":"Huan","family":"He","sequence":"additional","affiliation":[{"name":"Information Science and Engineering College, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/app10072443"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2020.03.005"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/mp.13433"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11771-019-4183-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/acb5b7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/acb000"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12030768"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1177\/0309524X221114621"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/acabdb"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11771-021-4817-4"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/acb78b"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110171"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112450"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s23187696"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108746"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s12206-022-0902-3"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110434"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1023\/B:MACH.0000008084.60811.49"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3389\/fenrg.2022.973794"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2020.01.004"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISMS.2010.13"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2021.3114353"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2022.109399"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1631\/jzus.A2000005"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-013-9393-z"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-58469-0_11"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2009.2013962"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2972859"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/M2VIP.2016.7827265"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/s17081729"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2669947"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10474065.pdf?arnumber=10474065","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T19:41:37Z","timestamp":1712000497000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10474065\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3378268","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}