{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,14]],"date-time":"2026-03-14T18:01:00Z","timestamp":1773511260479,"version":"3.50.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61827802"],"award-info":[{"award-number":["61827802"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U2241259"],"award-info":[{"award-number":["U2241259"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3385845","type":"journal-article","created":{"date-parts":[[2024,4,8]],"date-time":"2024-04-08T20:49:50Z","timestamp":1712609390000},"page":"1-8","source":"Crossref","is-referenced-by-count":6,"title":["High-Precision Temperature Measurement Using Frequency-Division Multiplexing Laser Dispersion Spectroscopy for Dynamic Combustion Monitoring"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8847-0001","authenticated-orcid":false,"given":"Rende","family":"Wang","sequence":"first","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0488-9604","authenticated-orcid":false,"given":"Lijun","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.pecs.2016.12.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41561-022-01001-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/PRJ.411870"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.pecs.2022.100997"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2738333"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2019.127533"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.2514\/1.B34905"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.06.005"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3328086"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab803b"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/24\/5\/055107"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/OE.18.026123"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.015143"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.proci.2018.06.184"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.fuel.2022.124852"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1111\/j.1749-6632.2012.06660.x"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s00340-018-6990-1"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/OL.461140"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2023.107497"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2998935"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2022.108285"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2022.132333"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2315737"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/AO.55.008698"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2022.131774"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.fuel.2021.121732"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.proci.2018.05.021"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10494328.pdf?arnumber=10494328","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,7]],"date-time":"2024-06-07T04:31:53Z","timestamp":1717734713000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10494328\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3385845","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}