{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T14:47:19Z","timestamp":1773154039405,"version":"3.50.1"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"2022 \u201cTongxin Program\u201d Special Research Program for Universities","award":["TX-H22-04"],"award-info":[{"award-number":["TX-H22-04"]}]},{"name":"Provincial Natural Science Foundation of Anhui","award":["2108085MF201"],"award-info":[{"award-number":["2108085MF201"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3386210","type":"journal-article","created":{"date-parts":[[2024,4,8]],"date-time":"2024-04-08T20:49:50Z","timestamp":1712609390000},"page":"1-10","source":"Crossref","is-referenced-by-count":13,"title":["U<sup>2<\/sup>D<sup>2<\/sup>PCB: Uncertainty-Aware Unsupervised Defect Detection on PCB Images Using Reconstructive and Discriminative Models"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6003-7185","authenticated-orcid":false,"given":"Changlin","family":"Chen","sequence":"first","affiliation":[{"name":"School of Instrument Science and Optoelectronics Engineering, Hefei University of Technology, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-6012-8051","authenticated-orcid":false,"given":"Qiman","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Computer Science and Information Engineering, Hefei University of Technology, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5462-3631","authenticated-orcid":false,"given":"Jin","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Optoelectronics Engineering, Hefei University of Technology, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4214-7233","authenticated-orcid":false,"given":"Haojie","family":"Xia","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Optoelectronics Engineering, Hefei University of Technology, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-3884-8832","authenticated-orcid":false,"given":"Pengrong","family":"Lin","sequence":"additional","affiliation":[{"name":"Beijing Microelectronics Technology Institute, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5905-3022","authenticated-orcid":false,"given":"Yong","family":"Wang","sequence":"additional","affiliation":[{"name":"Beijing Microelectronics Technology Institute, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4849-5535","authenticated-orcid":false,"given":"Mengke","family":"Tian","sequence":"additional","affiliation":[{"name":"Beijing Microelectronics Technology Institute, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7760-7562","authenticated-orcid":false,"given":"Rencheng","family":"Song","sequence":"additional","affiliation":[{"name":"Department of Biomedical Engineering and Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CISP.2011.6100553"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/RAECS.2014.6799537"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICEEE.2012.6421182"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2020.103910"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/WCICA.2008.4592931"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2014.2305654"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115673"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3057026"},{"key":"ref10","article-title":"YOLOX: Exceeding YOLO series in 2021","author":"Ge","year":"2021","journal-title":"arXiv:2107.08430"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/trit.2019.0019"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICIIBMS55689.2022.10004785"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3201945"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3153997"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3151926"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3168897"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2795178"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01392"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3142326"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00822"},{"key":"ref21","article-title":"Self-supervised guided segmentation framework for unsupervised anomaly detection","author":"Xing","year":"2022","journal-title":"arXiv:2209.12440"},{"key":"ref22","first-page":"1","article-title":"What uncertainties do we need in Bayesian deep learning for computer vision?","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"30","author":"Kendall"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1111\/mice.12533"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/s20061650"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2024.112138"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1049\/itr2.12272"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-023-10562-9"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2020.3030974"},{"key":"ref32","article-title":"A PCB dataset for defects detection and classification","author":"Huang","year":"2019","journal-title":"arXiv:1901.08204"},{"key":"ref33","article-title":"Online PCB defect detector on a new PCB defect dataset","author":"Tang","year":"2019","journal-title":"arXiv:1902.06197"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2018.8275"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1108\/CW-06-2017-0028"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/WiSPNET.2017.8299858"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3106057"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2019.1183"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.rineng.2023.100968"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.32604\/cmc.2023.046376"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3339561"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3322483"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1155\/2023\/2024237"},{"key":"ref45","first-page":"527","article-title":"A real-time PCB defect detector based on supervised and semi-supervised learning","volume-title":"Proc. Eur. Symp. Artif. Neural Netw.","author":"He"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10494766.pdf?arnumber=10494766","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T04:03:02Z","timestamp":1725163382000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10494766\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":45,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3386210","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}