{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T15:11:59Z","timestamp":1773414719947,"version":"3.50.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62373277"],"award-info":[{"award-number":["62373277"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51976137"],"award-info":[{"award-number":["51976137"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3387924","type":"journal-article","created":{"date-parts":[[2024,4,12]],"date-time":"2024-04-12T17:27:04Z","timestamp":1712942824000},"page":"1-15","source":"Crossref","is-referenced-by-count":7,"title":["Generalized Gaussian Distribution-Based Interval Principal Component Analysis (GGD-IPCA) for Anomaly Detection of Processes With Uncertainty"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9829-0776","authenticated-orcid":false,"given":"Shumei","family":"Zhang","sequence":"first","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2672-5352","authenticated-orcid":false,"given":"Sijia","family":"Wang","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8478-8928","authenticated-orcid":false,"given":"Feng","family":"Dong","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3271737"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2022.108639"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3196742"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2018.01.016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2022.03.069"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2018.12.048"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3034975"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b06554"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2014.08.009"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2020.104232"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/659\/1\/012035"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2022.109120"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2018.11.063"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2009.10.003"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2018.01.006"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2019.03.068"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2022.04.010"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/76.350779"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177704481"},{"issue":"3","key":"ref20","first-page":"5","article-title":"Extension de l\u2019analyse en composantes principales \u00e0 des donn\u00e9es de type intervalle","volume":"45","author":"Cazes","year":"1997","journal-title":"Revue Statistique appliqu\u00e9e"},{"key":"ref21","article-title":"Extension des m\u00e9thodes d\u2019analyse factorielle \u00e0 des donn\u00e9es de type intervalle","author":"Chouakria","year":"1998"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s001800050038"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2003.11.005"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/10618600.2012.679895"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2012.01.018"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/SSD54932.2022.9955943"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2020.10.059"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jocs.2018.04.017"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/app11083448"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3019365"},{"key":"ref31","volume-title":"Interval Analysis","author":"Moore","year":"1966"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2012.2214050"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1515\/ipc-2016-0019"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3233\/JIFS-189755"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3315352"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0409-4_8"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10497675.pdf?arnumber=10497675","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,3]],"date-time":"2024-05-03T18:38:14Z","timestamp":1714761494000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10497675\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3387924","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}