{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,14]],"date-time":"2026-03-14T18:27:57Z","timestamp":1773512877408,"version":"3.50.1"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3394499","type":"journal-article","created":{"date-parts":[[2024,4,29]],"date-time":"2024-04-29T17:36:28Z","timestamp":1714412188000},"page":"1-10","source":"Crossref","is-referenced-by-count":1,"title":["A Low-Cost In Situ Monitoring System for the Measurement of Losses in Resonant Cavities"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3151-4384","authenticated-orcid":false,"given":"Ronny","family":"Peter","sequence":"first","affiliation":[{"name":"Chair of Measurement and Control Systems, Universität Bayreuth, Bayreuth, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-6932-5530","authenticated-orcid":false,"given":"Jannik","family":"Lutz","sequence":"additional","affiliation":[{"name":"Chair of Measurement and Control Systems, Universität Bayreuth, Bayreuth, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2000-4730","authenticated-orcid":false,"given":"Gerhard","family":"Fischerauer","sequence":"additional","affiliation":[{"name":"Chair of Measurement and Control Systems, Universität Bayreuth, Bayreuth, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2014.2305576"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.4271\/2010-01-2126"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/21\/3\/035108"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/BF02086217"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/0470020466"},{"key":"ref6","volume-title":"Survey of Instrumentation and Measurement","author":"Dyer","year":"2001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.01.030"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1515\/teme-2019-0139"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/BF02086216"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/19.816108"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2004.11.006"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.03.020"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/9\/10\/015"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/17\/6\/R01"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/19.746583"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/15\/4\/019"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1985.1133108"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2313415"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab0e65"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac5134"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1987.1133588"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2008.2003542"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.66.163"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.2528\/pierb12071901"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tmtt.2018.2791934"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/047012458X"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.5194\/jsss-4-255-2015"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/lmwc.2018.2808422"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/9780470495056"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1515\/crll.1913.143.177"},{"key":"ref31","volume-title":"Building a Low-Cost White-Noise Generator","year":"2005"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1049\/pi-c.1960.0041"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/19.816109"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/22.920149"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifset.2021.102837"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.96.062607"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.clay.2021.106072"},{"key":"ref38","article-title":"Zahlenwerte und funktionen aus physik, chemie, astronomie, geophysik und technik\u20143","volume-title":"Teil: Elektrotechnik, Lichttechnik, R\u00f6ntgentechnik","author":"Landolt","year":"1957"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s10800-009-0060-7"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/9780470546710"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/t-ed.1976.18438"},{"key":"ref42","volume-title":"The Art of Electronics","author":"Horowitz","year":"2015"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1049\/el:19750219"},{"key":"ref44","volume-title":"Fundamentals of Microelectronics","author":"Razavi","year":"2008"},{"key":"ref45","volume-title":"Halbleiterschaltungstechnik","author":"Tietze","year":"2012"},{"key":"ref46","volume-title":"Halbleiterschaltungstechnik","year":"1959"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10509853.pdf?arnumber=10509853","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,11]],"date-time":"2024-05-11T04:22:42Z","timestamp":1715401362000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10509853\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":46,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3394499","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}