{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,27]],"date-time":"2025-07-27T07:42:53Z","timestamp":1753602173546,"version":"3.37.3"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2021YFA120050"],"award-info":[{"award-number":["2021YFA120050"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61874030"],"award-info":[{"award-number":["61874030"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Natural Science Research Start-up Foundation of Recruiting Talents of Nanjing University of Posts and Telecommunications","award":["NY223157","NY223156"],"award-info":[{"award-number":["NY223157","NY223156"]}]},{"name":"Shanghai Science and Technology Commission \u201cExplorer Project\u201d","award":["21TS1401300"],"award-info":[{"award-number":["21TS1401300"]}]},{"name":"Natural Science Foundation of Shanghai","award":["23ZR1405900"],"award-info":[{"award-number":["23ZR1405900"]}]},{"name":"Guangdong Province Research and Development in Key Fields from Guangdong Greater Bay Area Institute of Integrated Circuit and System","award":["2021B0101280002"],"award-info":[{"award-number":["2021B0101280002"]}]},{"name":"Guangzhou City Research and Development Program in Key Field","award":["20210302001"],"award-info":[{"award-number":["20210302001"]}]},{"name":"Project funded by China Postdoctoral Science Foundation","award":["2023M732916"],"award-info":[{"award-number":["2023M732916"]}]},{"DOI":"10.13039\/501100002367","name":"Chinese Academy of Sciences","doi-asserted-by":"publisher","award":["KLSDTJJ2022-2"],"award-info":[{"award-number":["KLSDTJJ2022-2"]}],"id":[{"id":"10.13039\/501100002367","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3398086","type":"journal-article","created":{"date-parts":[[2024,5,8]],"date-time":"2024-05-08T17:31:55Z","timestamp":1715189515000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["A Novel NH<sub>3<\/sub> Sensing Mechanism Based on Au Pads Activated Schottky Barrier MOSFET on Silicon-on-Insulator With Extremely High Sensitivity at Room Temperature"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-1033-4023","authenticated-orcid":false,"given":"Kai","family":"Xiao","sequence":"first","affiliation":[{"name":"Shanghai Institute of Intelligent Electronics and Systems, School of Information Science and Technology, Fudan University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5871-1946","authenticated-orcid":false,"given":"Haihua","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-7444-184X","authenticated-orcid":false,"given":"Hui","family":"Xie","sequence":"additional","affiliation":[{"name":"Shanghai Institute of Intelligent Electronics and Systems, School of Information Science and Technology, Fudan University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-9773-6595","authenticated-orcid":false,"given":"Siyuan","family":"Li","sequence":"additional","affiliation":[{"name":"Shanghai Institute of Intelligent Electronics and Systems, School of Information Science and Technology, Fudan University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-5869-8606","authenticated-orcid":false,"given":"Zekun","family":"Zhao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-0128-5374","authenticated-orcid":false,"given":"Ziyue","family":"Cui","sequence":"additional","affiliation":[{"name":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9203-554X","authenticated-orcid":false,"given":"Qiumeng","family":"Chen","sequence":"additional","affiliation":[{"name":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7301-1013","authenticated-orcid":false,"given":"Peng","family":"Zhou","sequence":"additional","affiliation":[{"name":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6154-4971","authenticated-orcid":false,"given":"Fanyu","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Silicon Device and Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6800-234X","authenticated-orcid":false,"given":"Yong","family":"Xu","sequence":"additional","affiliation":[{"name":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8521-5075","authenticated-orcid":false,"given":"Yu-Long","family":"Jiang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6339-4006","authenticated-orcid":false,"given":"Jing","family":"Wan","sequence":"additional","affiliation":[{"name":"Shanghai Institute of Intelligent Electronics and Systems, School of Information Science and Technology, Fudan University, Shanghai, China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/ted.2019.2901007"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.snb.2019.03.073"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1038\/s41598-021-86686-1"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.snb.2015.09.094"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1021\/nl9034219"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1021\/nn101950n"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1038\/ncomms5376"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/j.ceramint.2014.03.109"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1126\/science.1109128"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1016\/j.ijhydene.2016.12.117"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/icias.2018.8540620"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.snb.2009.04.070"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1126\/science.1194210"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1021\/nl3001293"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/j.snb.2020.129240"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/LED.2017.2707592"},{"volume-title":"MOS\/Metal Oxide Semiconductor\/Physics and Technology","year":"1982","author":"Nicollian","key":"ref17"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1016\/j.snb.2012.06.060"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1016\/j.sse.2018.12.009"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/JSEN.2019.2952582"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1021\/acsami.7b10584"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1063\/1.4827184"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1021\/acsami.1c00585"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.3390\/chemosensors10110467"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1063\/1.1471245"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/TED.2022.3233544"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/JSEN.2020.3038647"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1109\/TED.2012.2214221"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1021\/acsnano.8b00580"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1016\/j.matchemphys.2019.121922"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1016\/j.ceramint.2022.06.066"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1088\/0957-4484\/22\/35\/355501"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1016\/j.snb.2016.04.010"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/10367905\/10522908.pdf?arnumber=10522908","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T07:06:45Z","timestamp":1725433605000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10522908\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3398086","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}