{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T18:49:34Z","timestamp":1773773374915,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2023YFB3308000"],"award-info":[{"award-number":["2023YFB3308000"]}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["62225302"],"award-info":[{"award-number":["62225302"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["623B2014"],"award-info":[{"award-number":["623B2014"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["92167108"],"award-info":[{"award-number":["92167108"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["62173023"],"award-info":[{"award-number":["62173023"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3428643","type":"journal-article","created":{"date-parts":[[2024,7,15]],"date-time":"2024-07-15T17:36:48Z","timestamp":1721065008000},"page":"1-10","source":"Crossref","is-referenced-by-count":7,"title":["BTCAN: A Binary Trend-Aware Network for Industrial Edge Intelligence and Application in Aero-Engine RUL Prediction"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6346-6930","authenticated-orcid":false,"given":"Lei","family":"Ren","sequence":"first","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-9899-6916","authenticated-orcid":false,"given":"Shixiang","family":"Li","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3834-4602","authenticated-orcid":false,"given":"Yuanjun","family":"Laili","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1989-6102","authenticated-orcid":false,"given":"Lin","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3318706"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3267362"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3291733"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3156965"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109151"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.11.009"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3091774"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/s22207851"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.105662"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2022.3224969"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3347782"},{"key":"ref12","article-title":"Binarized neural networks: Training deep neural networks with weights and activations constrained to +1 or -1","author":"Courbariaux","year":"2016","journal-title":"arXiv:1602.02830"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46493-0_32"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58568-6_9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01267-0_44"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2891463"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2022.3183252"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109605"},{"key":"ref19","volume-title":"7 Series FPGAs Data Sheet: Overview","year":"2020"},{"key":"ref20","article-title":"BiBERT: Accurate fully binarized BERT","author":"Qin","year":"2022","journal-title":"arXiv:2203.06390"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108590"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3057030"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2972443"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2983760"},{"key":"ref25","article-title":"Estimating or propagating gradients through stochastic neurons for conditional computation","author":"Bengio","year":"2013","journal-title":"arXiv:1308.3432"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/PHM.2008.4711414"},{"issue":"11","key":"ref27","first-page":"1","article-title":"Visualizing data using t-SNE","volume":"9","author":"Van der Maaten","year":"2008","journal-title":"J. Mach. Learn. Res."},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICPHM.2017.7998311"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.11.021"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10599276.pdf?arnumber=10599276","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,25]],"date-time":"2024-07-25T17:24:22Z","timestamp":1721928262000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10599276\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3428643","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}