{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,26]],"date-time":"2026-08-26T15:25:00Z","timestamp":1787757900025,"version":"build-2784847793"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"State Grid Corporation of China through the \u201cResearch on Key Technologies and Equipment of Multi Unmanned Aerial Vehicle (UAV) Collaborative Inspection for Distribution Power Lines\u201d Project","award":["5108-202218280A-2-369-XG"],"award-info":[{"award-number":["5108-202218280A-2-369-XG"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3436123","type":"journal-article","created":{"date-parts":[[2024,7,31]],"date-time":"2024-07-31T20:43:02Z","timestamp":1722458582000},"page":"1-10","source":"Crossref","is-referenced-by-count":4,"title":["CapNet: Learning Insulator Self-Blast From Bounding Box"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6973-7268","authenticated-orcid":false,"given":"Di","family":"Jiang","sequence":"first","affiliation":[{"name":"College of Electrical Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2495-4701","authenticated-orcid":false,"given":"Yuan","family":"Cao","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0761-4692","authenticated-orcid":false,"given":"Qiang","family":"Yang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2017.12.016"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2965635"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3201499"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2871750"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3112227"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3031194"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3194909"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2944741"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3305667"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/app9102009"},{"key":"ref11","volume-title":"Unifying Public Datasets for Insulator Detection and Fault Classification in Electrical Power Lines","author":"Vieira","year":"2024"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2021.12.093"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00822"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00954"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00982"},{"key":"ref16","volume-title":"YOLOv8","year":"2024"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01221"},{"key":"ref18","first-page":"596","article-title":"FixMatch: Simplifying semi-supervised learning with consistency and confidence","volume-title":"Proc. Adv. Neural Inf. Process. Syst. (NIPS)","volume":"33","author":"Sohn"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2891123"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108054"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111238"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/s19133014"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1093\/nsr\/nwx106"},{"key":"ref24","first-page":"1","article-title":"Mean teachers are better role models: Weight-averaged consistency targets improve semi-supervised deep learning results","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"30","author":"Tarvainen"},{"key":"ref25","first-page":"1","article-title":"MixMatch: A holistic approach to semi-supervised learning","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"32","author":"Berthelot"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.181"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00232"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3012780"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.122739"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-19821-2_31"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01392"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.01954"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.02348"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00283"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.02346"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00724"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP46576.2022.9897777"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2016.2577031"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00972"},{"key":"ref40","volume-title":"YOLOv5","year":"2024"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10616112.pdf?arnumber=10616112","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,11]],"date-time":"2024-08-11T04:04:51Z","timestamp":1723349091000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10616112\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3436123","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}