{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T04:11:28Z","timestamp":1742875888321,"version":"3.40.2"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004934","name":"Kummer Innovation and Entrepreneurship Doctoral Fellowship at Missouri University of Science and Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004934","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3440402","type":"journal-article","created":{"date-parts":[[2024,8,8]],"date-time":"2024-08-08T18:29:13Z","timestamp":1723141753000},"page":"1-12","source":"Crossref","is-referenced-by-count":3,"title":["Effect of Signal Modulation on Active Microwave Thermography"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-6385-0428","authenticated-orcid":false,"given":"Logan M.","family":"Wilcox","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Microwave Sensing (μSense) Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0227-9247","authenticated-orcid":false,"given":"Mathias","family":"Bonmarin","sequence":"additional","affiliation":[{"name":"Institute of Computational Physics, Zurich University of Applied Science, Winterthur, Switzerland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8725-5484","authenticated-orcid":false,"given":"Kristen M.","family":"Donnell","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Microwave Sensing (μSense) Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"volume-title":"Theory and Practice of Infrared Technology for Nondestructive Testing","year":"2001","author":"Maldague","key":"ref1"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.ndteint.2013.03.008"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.ndteint.2014.03.004"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/ISSE.2010.5547297"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1088\/1361-6501\/aa825a"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TIM.2020.3003394"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TIM.2016.2596080"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TIM.2021.3060596"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/I2MTC43012.2020.9129215"},{"key":"ref10","first-page":"502","article-title":"Microwave excitation for thermographic NDE: An experimental study and some theoretical evaluations","volume":"54","author":"d\u2019Ambrosio","year":"1995","journal-title":"Mater. Eval."},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.4236\/msa.2013.410074"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1007\/s11012-014-9981-2"},{"key":"ref13","first-page":"24","article-title":"Non destructive evaluation of composite materials with new thermal methods","volume-title":"Proc. 15th Eur. Conf. Compos. Mater. (ECCM)","author":"Galietti"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/TIM.2024.3350148"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1126\/sciadv.abd8405"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/I2MTC48687.2022.9806511"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.3390\/ma9040231"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1080\/09349840802366617"},{"key":"ref19","first-page":"7","article-title":"Thermographic inspection of composite materials","volume-title":"Proc. Nat. Seminar Non-Destructive Eval.","volume":"12","author":"Srinivas"},{"volume-title":"Antenna Theory: Analaysis and Design","year":"2005","author":"Balanis","key":"ref20"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/TIM.2013.2291952"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1021\/je00058a001"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1201\/9781315380476"},{"volume-title":"Cuming Microwave, C-RAM FF-2 Technical Bulletin","year":"2023","key":"ref24"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1115\/1.1311272"},{"key":"ref26","first-page":"1","article-title":"Characterization of defects in curved CFRP samples using pulsed thermography and 3D finite element simulation","volume-title":"Proc. 9th Int. Conf. Quant. Infr. Thermography","author":"Mayr"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1016\/j.ijheatmasstransfer.2012.06.059"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1007\/978-3-642-02417-7"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1109\/MIM.2021.9448265"},{"volume-title":"500-3000 MHz 50 Watts Linear Power RD Amplifier","year":"2014","key":"ref30"},{"volume-title":"HMC833LP6GE Fractional-N PLL With Integrated VCO","year":"2016","key":"ref31"},{"volume-title":"Teledyne FLIR LLC, FLIR T430sc","year":"2023","key":"ref32"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.32548\/RS.2023.093"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1007\/s10921-019-0559-8"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10630812.pdf?arnumber=10630812","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T18:05:40Z","timestamp":1742839540000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10630812\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3440402","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}