{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T18:20:06Z","timestamp":1771698006704,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51906209"],"award-info":[{"award-number":["51906209"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"European Union\u2019s Horizon 2020 Research and Innovation Programme through the Marie Sklodowska-Curie actions COFUND Transnational Research and Innovation Network at Edinburgh","doi-asserted-by":"publisher","award":["801215"],"award-info":[{"award-number":["801215"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3440409","type":"journal-article","created":{"date-parts":[[2024,8,12]],"date-time":"2024-08-12T17:29:59Z","timestamp":1723483799000},"page":"1-12","source":"Crossref","is-referenced-by-count":4,"title":["Digital Twin-Assisted 3-D Electrical Capacitance Tomography for Multiphase Flow Imaging"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7244-045X","authenticated-orcid":false,"given":"Shengnan","family":"Wang","sequence":"first","affiliation":[{"name":"College of Metrology Measurement and Instrument, China Jiliang University, Zhejiang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8855-4520","authenticated-orcid":false,"given":"Yi","family":"Li","sequence":"additional","affiliation":[{"name":"Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3018-8169","authenticated-orcid":false,"given":"Zhou","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Biomedical Engineering, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4437-2212","authenticated-orcid":false,"given":"Ming","family":"Kong","sequence":"additional","affiliation":[{"name":"College of Metrology Measurement and Instrument, China Jiliang University, Zhejiang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5797-9753","authenticated-orcid":false,"given":"Yunjie","family":"Yang","sequence":"additional","affiliation":[{"name":"SMART Group, Institute for Digital Communications, School of Engineering, The University of Edinburgh, Edinburgh, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3046013"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2009.11.001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3013080"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2855200"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3238747"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2021.107608"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/2631-8695\/acc513"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac8220"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.partic.2021.10.001"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/ie300746q"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3047603"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3073934"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/aic.15879"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2013.0124"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/17415977.2015.1113961"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3382939"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6579\/ab21b2"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3178119"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1093\/gji\/ggab024"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3200758"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2021.3054167"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2022.3154108"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3197804"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/5.0103187"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1038\/s44172-022-00042-3"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/201"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3035384"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1006\/jcph.2001.6715"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcp.2005.04.007"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2450351"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.dam.2018.11.026"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10634121.pdf?arnumber=10634121","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,19]],"date-time":"2024-08-19T17:27:06Z","timestamp":1724088426000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10634121\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3440409","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}