{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T18:15:30Z","timestamp":1760552130692,"version":"3.37.3"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3441023","type":"journal-article","created":{"date-parts":[[2024,8,15]],"date-time":"2024-08-15T17:32:32Z","timestamp":1723743152000},"page":"1-10","source":"Crossref","is-referenced-by-count":5,"title":["FPGA-Based Planar Sensor Electrical Impedance Tomography (FPGA-psEIT) System Characterized by Double Feedback Howland Constant- Current Pump and Programmable Front-End Measurement"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0014-5045","authenticated-orcid":false,"given":"Isnan","family":"Nur Rifai","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering and Informatics, Vocational College, Universitas Gadjah Mada, Yogyakarta, Indonesia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0509-841X","authenticated-orcid":false,"given":"Prima Asmara","family":"Sejati","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Informatics, Vocational College, Universitas Gadjah Mada, Yogyakarta, Indonesia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7075-6602","authenticated-orcid":false,"given":"Shinsuke","family":"Akita","sequence":"additional","affiliation":[{"name":"Department of Plastic, Reconstructive, and Esthetic Surgery, Graduate School of Medicine, Chiba University, Chiba, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3855-7202","authenticated-orcid":false,"given":"Masahiro","family":"Takei","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, Division of Fundamental Engineering, Graduate School of Science and Engineering, Chiba University, Chiba, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1117\/1.jmi.8.3.033503"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/abc108"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.powtec.2022.117140"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3282295"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-022-27060-7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/2057-1976\/aa50a7"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3166796"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/2057-1976\/aadff3"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2837741"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3124059"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2007.903516"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/BioCAS.2016.7833712"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3934\/ipi.2015.9.211"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s11517-015-1274-y"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/acc752"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/2057-1976\/acd4c6"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/BF02520003"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6579\/ab8f74"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/29\/6\/S15"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/22\/11\/115801"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/s22031025"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3389\/felec.2022.848618"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.110983"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/ki.2014.269"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2987534"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1137\/0914086"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1137\/0152060"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2895929"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2012.2199114"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.2478\/joeb-2023-0004"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/actea.2019.8851095"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2020.3022483"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2013.2256785"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3390\/electronics4030507"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1088\/2057-1976\/ace7d8"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1002\/nbm.3224"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.jid.2021.06.013"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1093\/rheumatology\/kew371"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1053\/j.ajkd.2015.08.027"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.jacc.2017.01.037"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10637792.pdf?arnumber=10637792","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,2]],"date-time":"2024-09-02T04:07:24Z","timestamp":1725250044000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10637792\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3441023","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}