{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T07:38:41Z","timestamp":1777621121476,"version":"3.51.4"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52005335"],"award-info":[{"award-number":["52005335"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52375111"],"award-info":[{"award-number":["52375111"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52205113"],"award-info":[{"award-number":["52205113"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3443331","type":"journal-article","created":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T17:34:25Z","timestamp":1723656865000},"page":"1-13","source":"Crossref","is-referenced-by-count":3,"title":["A Dual-Level Adaptation Framework for Multichannel Cross-Condition Fault Diagnosis"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1633-0429","authenticated-orcid":false,"given":"Huiming","family":"Jiang","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-9922-4155","authenticated-orcid":false,"given":"Haifeng","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6978-7142","authenticated-orcid":false,"given":"Jing","family":"Yuan","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2150-6257","authenticated-orcid":false,"given":"Qian","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2246-7966","authenticated-orcid":false,"given":"Jin","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Mechanical System and Vibration, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3901\/JME.2018.05.094"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3901\/JME.2019.07.001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3141783"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3122742"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2022.101797"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3035385"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2021.126318"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109352"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3213016"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3224988"},{"issue":"8","key":"ref11","first-page":"966","article-title":"Multichannel information fusion and deep transfer learning for rotating machinery fault diagnosis","volume":"34","author":"Zhang","year":"2023","journal-title":"China Mech. Eng."},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2022.11.012"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2020.106396"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2023.102005"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108968"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2020.106214"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3249249"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3251399"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2968923"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3105236"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10898-014-0231-x"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2021.04.003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2017.2715285"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3132051"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.72"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s10107-012-0584-1"},{"key":"ref27","volume-title":"Bearing Data Center | Case School of Engineering | Case Western Reserve University","year":"2021"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2575318"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3071232"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107571"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3230479"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108343"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10636285.pdf?arnumber=10636285","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,2]],"date-time":"2024-09-02T04:42:16Z","timestamp":1725252136000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10636285\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3443331","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}