{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,24]],"date-time":"2026-07-24T14:58:17Z","timestamp":1784905097833,"version":"3.55.0"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Payatek Ltd., Mashhad, Iran"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3446629","type":"journal-article","created":{"date-parts":[[2024,8,20]],"date-time":"2024-08-20T15:37:03Z","timestamp":1724168223000},"page":"1-8","source":"Crossref","is-referenced-by-count":7,"title":["An Improved Readout Circuit for Enhanced Accuracy and Frame Rate in Large Resistive Sensor Arrays Using Adaptive Techniques"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-2962-6990","authenticated-orcid":false,"given":"Mohammad Tavakkoli","family":"Ghouchani","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Ferdowsi University of Mashhad, Mashhad, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-3366-6557","authenticated-orcid":false,"given":"Mehran Jalaian Mohammad","family":"Nia","sequence":"additional","affiliation":[{"name":"Payatek Ltd., Mashhad, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8422-1809","authenticated-orcid":false,"given":"Reza","family":"Lotfi","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Ferdowsi University of Mashhad, Mashhad, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3225063"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3181281"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/s17112513"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3210599"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3274645"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2477494"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2010.2060186"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2004.833152"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s16020253"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2641001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3219492"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2562638"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2878580"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.845969"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.922075"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.831500"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2537841"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.891724"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2038292"},{"key":"ref20","volume-title":"Tekscan Strideway","year":"2023"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1155\/2018\/9735741"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2955015"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/s23031406"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3353071"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2662803"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/s140712816"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/s16020149"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/s16050720"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3277714"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2013.2277516"},{"key":"ref31","volume-title":"Coarse scan and targeted active mode scan for touch","author":"Shahparnia","year":"2016"},{"key":"ref32","volume-title":"Scanning capacitive semiconductor fingerprint detector","author":"Kramer","year":"2012"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3000494"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3005227"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10640068.pdf?arnumber=10640068","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,10]],"date-time":"2024-10-10T15:18:57Z","timestamp":1728573537000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10640068\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3446629","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}