{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T16:19:00Z","timestamp":1781281140127,"version":"3.54.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3446651","type":"journal-article","created":{"date-parts":[[2024,8,20]],"date-time":"2024-08-20T15:37:03Z","timestamp":1724168223000},"page":"1-8","source":"Crossref","is-referenced-by-count":16,"title":["A DGS-CPW Microwave Sensor Loaded With SRR for Solid Material Measurement"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-0929-496X","authenticated-orcid":false,"given":"YuXiang","family":"Gong","sequence":"first","affiliation":[{"name":"School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5425-2738","authenticated-orcid":false,"given":"Guohua","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-1107-1567","authenticated-orcid":false,"given":"Shuren","family":"Jiang","sequence":"additional","affiliation":[{"name":"School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8422-8648","authenticated-orcid":false,"given":"Jianyuan","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2050-0320","authenticated-orcid":false,"given":"TianYu","family":"Qi","sequence":"additional","affiliation":[{"name":"School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/mim.2016.7384959"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2020.3043304"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tbcas.2020.3038589"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3075576"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2019.2951172"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.4953465"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107805"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2020.3041014"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3216578"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2018.2875996"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/s19030498"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3110611"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2993182"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3130669"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2652121"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2949695"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3221729"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.111769"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3124329"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3205639"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2682266"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2938853"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2852657"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2840691"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3113135"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3200600"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3307172"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3135874"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3265745"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10640157.pdf?arnumber=10640157","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,30]],"date-time":"2024-08-30T17:43:18Z","timestamp":1725039798000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10640157\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3446651","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}