{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,22]],"date-time":"2026-01-22T02:25:01Z","timestamp":1769048701175,"version":"3.49.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["62071149"],"award-info":[{"award-number":["62071149"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61671177"],"award-info":[{"award-number":["61671177"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFB3304000"],"award-info":[{"award-number":["2022YFB3304000"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3450068","type":"journal-article","created":{"date-parts":[[2024,8,26]],"date-time":"2024-08-26T17:26:02Z","timestamp":1724693162000},"page":"1-14","source":"Crossref","is-referenced-by-count":7,"title":["Parameter Estimation of Hybrid LFM and MPSK Pulse Sequences Based on Sub-Nyquist Sampling"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1256-6442","authenticated-orcid":false,"given":"Shuangxing","family":"Yun","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0317-9697","authenticated-orcid":false,"given":"Ning","family":"Fu","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7397-3458","authenticated-orcid":false,"given":"Liyan","family":"Qiao","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MAES.2021.3081176"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MAES.2023.3242635"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/JCC.2019.08.015"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MAES.2018.170031"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MAES.2020.2988331"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/JCC.2020.01.001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3267068"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2018.2868137"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MAES.2016.150193"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3049410"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2014.120475"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914998"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2002.1003065"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2016.2625274"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2018.2858213"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2022.3204402"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2020.3041089"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3158986"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2023.104267"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2977742"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3328704"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2895438"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2018.2887104"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3261930"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3317911"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3055938"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2014.6853909"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2016.7472432"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2017.7953019"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2022.3184067"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2020.3047018"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2013.2293343"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2014.2335751"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3320730"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2022.3141009"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2011.2176934"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10648820.pdf?arnumber=10648820","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,22]],"date-time":"2025-03-22T00:34:57Z","timestamp":1742603697000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10648820\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3450068","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}