{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,26]],"date-time":"2026-07-26T03:24:17Z","timestamp":1785036257049,"version":"3.55.0"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51775005"],"award-info":[{"award-number":["51775005"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"Science and Technology Project of China State Railway Group Company Ltd.","doi-asserted-by":"publisher","award":["N2023J042"],"award-info":[{"award-number":["N2023J042"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3450104","type":"journal-article","created":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T17:47:19Z","timestamp":1725644839000},"page":"1-9","source":"Crossref","is-referenced-by-count":17,"title":["The CTIgram: A Novel Optimal Demodulation Band Selection Method and Its Applications in Condition Monitoring of Rotating Machinery"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-5881-9949","authenticated-orcid":false,"given":"Jifeng","family":"Sui","sequence":"first","affiliation":[{"name":"Department of Materials and Manufacturing, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9109-891X","authenticated-orcid":false,"given":"Chaoyong","family":"Ma","sequence":"additional","affiliation":[{"name":"Department of Materials and Manufacturing, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1928-0754","authenticated-orcid":false,"given":"Zuhua","family":"Jiang","sequence":"additional","affiliation":[{"name":"Department of Materials and Manufacturing, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3513-8988","authenticated-orcid":false,"given":"Kun","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Materials and Manufacturing, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2206-8968","authenticated-orcid":false,"given":"Yonggang","family":"Xu","sequence":"additional","affiliation":[{"name":"Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2024.110241"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2024.01.003"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3215545"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109832"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JOE.1984.1145602"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.11.013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2004.09.001"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.04.034"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.12.009"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.05.003"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108374"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111346"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3390161"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aa8a57"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.02.034"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.2307\/3006993"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10668-017-9913-0"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107582"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111629"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108620"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10666967.pdf?arnumber=10666967","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T17:45:54Z","timestamp":1726076754000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10666967\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3450104","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}