{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T15:29:34Z","timestamp":1772206174380,"version":"3.50.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/USG.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"U.S. Scientific and Technical Research and Services Project","award":["FY246750325"],"award-info":[{"award-number":["FY246750325"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3458037","type":"journal-article","created":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T17:45:39Z","timestamp":1726076739000},"page":"1-11","source":"Crossref","is-referenced-by-count":4,"title":["On Digital Signal Processing of Time Series for Spectrum Estimation"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0415-9433","authenticated-orcid":false,"given":"Dazhen","family":"Gu","sequence":"first","affiliation":[{"name":"Shared Spectrum Metrology Group, National Institute of Standards and Technology, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2992-1738","authenticated-orcid":false,"given":"Jacob","family":"Rezac","sequence":"additional","affiliation":[{"name":"High-Speed Waveform Metrology Group, National Institute of Standards and Technology, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1524-1504","authenticated-orcid":false,"given":"Xifeng","family":"Lu","sequence":"additional","affiliation":[{"name":"Shared Spectrum Metrology Group, National Institute of Standards and Technology, Boulder, CO, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0711-5700","authenticated-orcid":false,"given":"Daniel","family":"Kuester","sequence":"additional","affiliation":[{"name":"Shared Spectrum Metrology Group, National Institute of Standards and Technology, Boulder, CO, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/19.997814"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3300473"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/10.623056"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1046\/j.1365-246X.2003.02079.x"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s00041-006-6904-1"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-6859-2_14"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1086\/684435"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0169902"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2008.4655353"},{"issue":"2","key":"ref10","doi-asserted-by":"crossref","first-page":"216","DOI":"10.3390\/metrology2020013","article-title":"The obtainable uncertainty for the frequency evaluation of tones with different spectral analysis techniques","volume":"2","author":"Dello Iacono","year":"2022","journal-title":"Metrology"},{"key":"ref11","volume-title":"Spectral Analysis of Signals","author":"Stoica","year":"1993"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM49742.2020.9191911"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2022.3148342"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.59161\/jcgmgum-6-2020"},{"key":"ref15","volume-title":"Signal Analysis Measurement Fundamentals","year":"2022"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1017\/9781139235723"},{"key":"ref17","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-387-75934-0","volume-title":"The Mathematical Theory of Finite Element Methods","author":"Brenner","year":"2008"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1982.12433"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/29.21705"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2022.3151415"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511622762"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2016.2559525"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2014.2364316"},{"key":"ref24","volume-title":"Spectrum and Spectral Density Estimation by the Discrete Fourier Transform (DFT), Including a Comprehensive List of Window Functions and Some New At-Top Windows","author":"Heinzel","year":"2002"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2017.07.005"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10677543.pdf?arnumber=10677543","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,3]],"date-time":"2024-10-03T05:33:36Z","timestamp":1727933616000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10677543\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3458037","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}