{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:09:59Z","timestamp":1740132599249,"version":"3.37.3"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["42274233"],"award-info":[{"award-number":["42274233"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100019035","name":"Young Top-Notch Talent Cultivation Program of Hubei Province","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100019035","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3470973","type":"journal-article","created":{"date-parts":[[2024,9,30]],"date-time":"2024-09-30T17:25:47Z","timestamp":1727717147000},"page":"1-11","source":"Crossref","is-referenced-by-count":0,"title":["Wide-Focus Imaging for Industrial Metal Workpieces Using Tower-Type Transmitting Coils"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9316-4749","authenticated-orcid":false,"given":"Huan","family":"Liu","sequence":"first","affiliation":[{"name":"School of Automation, China University of Geosciences, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-3294-4270","authenticated-orcid":false,"given":"Jinbo","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Automation, China University of Geosciences, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2103-5515","authenticated-orcid":false,"given":"Haobin","family":"Dong","sequence":"additional","affiliation":[{"name":"School of Automation, China University of Geosciences, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7241-3483","authenticated-orcid":false,"given":"Zheng","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Engineering, University of British Columbia, Kelowna, BC, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0741-310X","authenticated-orcid":false,"given":"Xiangyun","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Geophysics and Geomatics, China University of Geosciences, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/photonics10121333"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3191722"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/AEECA52519.2021.9574344"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110352"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmatprotec.2012.03.002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.41.374"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2014.05.011"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/s43586-021-00015-4"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2015.2473851"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/su141911853"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2917236"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2676460"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LMAG.2016.2520903"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2804352"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2324791"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2869362"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2714147"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/REEPE49198.2020.9059109"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/0950-7671\/26\/8\/307"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3139672"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2010.2044769"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/s17112651"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1063\/5.0063450"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10700782.pdf?arnumber=10700782","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,14]],"date-time":"2025-01-14T19:45:33Z","timestamp":1736883933000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10700782\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3470973","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}