{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,20]],"date-time":"2025-06-20T08:11:58Z","timestamp":1750407118185,"version":"3.37.3"},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Natural Science Fund for Distinguished Young Scholars","award":["61925305"],"award-info":[{"award-number":["61925305"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61988101"],"award-info":[{"award-number":["61988101"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62173145","62403136"],"award-info":[{"award-number":["62173145","62403136"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"State Key Laboratory of Industrial Control Technology, China","doi-asserted-by":"publisher","award":["ICT2024A23"],"award-info":[{"award-number":["ICT2024A23"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Key Laboratory of Industrial Internet of Things and Networked Control","award":["2020FF02"],"award-info":[{"award-number":["2020FF02"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3472806","type":"journal-article","created":{"date-parts":[[2024,10,3]],"date-time":"2024-10-03T17:21:14Z","timestamp":1727976074000},"page":"1-14","source":"Crossref","is-referenced-by-count":1,"title":["A Transferable Ensemble Additive Network for Interpretable Prediction of Key Performance Indicators"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3822-3221","authenticated-orcid":false,"given":"Cheng","family":"Su","sequence":"first","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9277-8415","authenticated-orcid":false,"given":"Xin","family":"Peng","sequence":"additional","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4962-7360","authenticated-orcid":false,"given":"Dan","family":"Yang","sequence":"additional","affiliation":[{"name":"Department of Information and Electrical Engineering, Hunan University of Science and Technology, Xiangtan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6845-1711","authenticated-orcid":false,"given":"Renzhi","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Artificial Intelligence and Automation, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9473-4851","authenticated-orcid":false,"given":"Haojie","family":"Huang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering and Automation and the Key Laboratory of Industrial Automation Control Technology and Information Processing, Fuzhou University, Fuzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4285-4739","authenticated-orcid":false,"given":"Weimin","family":"Zhong","sequence":"additional","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.tibtech.2006.09.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2016.05.068"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10311-018-0785-9"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.2166\/wst.2007.604"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/w6010086"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2995068"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.scitotenv.2022.154930"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.seta.2024.103670"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2021.128076"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jenvman.2021.114020"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2020.106516"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b05087"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1155\/2020\/6347625"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.cej.2023.143483"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3122171"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3075016"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2009.191"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3400066"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2022.3217046"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2021.3117407"},{"key":"ref21","article-title":"Deep domain confusion: Maximizing for domain invariance","author":"Tzeng","year":"2014","journal-title":"arXiv:1412.3474"},{"key":"ref22","first-page":"97","article-title":"Learning transferable features with deep adaptation networks","volume-title":"Proc. 32nd Int. Conf. Mach. Learn.","volume":"37","author":"Long"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2018.2868685"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00151"},{"key":"ref25","first-page":"1749","article-title":"Representation subspace distance for domain adaptation regression","volume-title":"Proc. ICML","author":"Chen"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.5555\/2946645.2946704"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.01130"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2022.110173"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111150"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICME.2019.00211"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TETCI.2021.3100641"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2021.108192"},{"key":"ref33","first-page":"4699","article-title":"Neural additive models: Interpretable machine learning with neural nets","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"34","author":"Agarwal"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1201\/9780203738535-7"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/s11704-019-8208-z"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3273676"},{"key":"ref37","first-page":"1205","article-title":"Optimal kernel choice for large-scale two-sample tests","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"25","author":"Gretton"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2020.3004555"},{"key":"ref39","article-title":"A comprehensive survey of deep transfer learning for anomaly detection in industrial time series: Methods, applications, and directions","author":"Yan","year":"2023","journal-title":"arXiv:2307.05638"},{"article-title":"Benchmark simulation model no. 1 (BSM1)","year":"2008","author":"Alex","key":"ref40"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TAI.2022.3185024"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2019.01.023"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2010.2091281"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10704649.pdf?arnumber=10704649","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,18]],"date-time":"2024-10-18T17:29:34Z","timestamp":1729272574000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10704649\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":43,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3472806","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}