{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,18]],"date-time":"2026-01-18T06:05:55Z","timestamp":1768716355195,"version":"3.49.0"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Plan","award":["2021YFB3203100"],"award-info":[{"award-number":["2021YFB3203100"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52075339"],"award-info":[{"award-number":["52075339"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3472848","type":"journal-article","created":{"date-parts":[[2024,10,3]],"date-time":"2024-10-03T17:21:14Z","timestamp":1727976074000},"page":"1-9","source":"Crossref","is-referenced-by-count":3,"title":["Accurate Coupling Coefficient Model for Eddy Current Sensor Displacement Calculation"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5088-0152","authenticated-orcid":false,"given":"Jie","family":"Yuan","sequence":"first","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-9615-6684","authenticated-orcid":false,"given":"Run","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0523-8005","authenticated-orcid":false,"given":"Huaming","family":"Lei","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3969-5148","authenticated-orcid":false,"given":"Kundong","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2021.112968"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/act12010016"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2933347"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3204083"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3266564"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s12652-018-1064-0"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/s21103463"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2022.3220556"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s18092842"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/isse.2016.7563231"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aa912e"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/icems52562.2021.9634432"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.1656680"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2015.2406053"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/iecon.2014.7048828"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113253"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.05.025"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICM-02.2002.1161544"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2003.822705"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.3033377"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.1663297"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2013.09.016"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10704752.pdf?arnumber=10704752","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,18]],"date-time":"2024-10-18T04:39:58Z","timestamp":1729226398000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10704752\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3472848","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}