{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:10:08Z","timestamp":1740132608943,"version":"3.37.3"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2023YFB3307300"],"award-info":[{"award-number":["2023YFB3307300"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72101148","72471145"],"award-info":[{"award-number":["72101148","72471145"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of Shanghai","doi-asserted-by":"publisher","award":["22ZR1433000"],"award-info":[{"award-number":["22ZR1433000"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3472855","type":"journal-article","created":{"date-parts":[[2024,10,9]],"date-time":"2024-10-09T17:47:44Z","timestamp":1728496064000},"page":"1-12","source":"Crossref","is-referenced-by-count":0,"title":["Flexible Degradation Modeling via the Integration of Local Models and Importance Sampling"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7030-6521","authenticated-orcid":false,"given":"Di","family":"Wang","sequence":"first","affiliation":[{"name":"Department of Industrial Engineering and Management, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4925-1962","authenticated-orcid":false,"given":"Andi","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Industrial and Systems Engineering, University of Wisconsin-Madison, Madison, WI, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6015-0981","authenticated-orcid":false,"given":"Changyue","family":"Song","sequence":"additional","affiliation":[{"name":"Changyue Song is an independent researcher, residing in Irvine, Irvine, CA, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2957965"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2018.1438007"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3260277"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3267362"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2011.10.019"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.02.016"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2883983"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2160949"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3084915"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-009-0356-9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2285318"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2020.1766729"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2021.3072363"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3195280"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2006.876609"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3236323"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.2307\/1269661"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2014.915891"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.04.005"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2284733"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2684821"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2015.2481703"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.108200"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1023\/A:1009629311100"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1023\/B:LIDA.0000036389.14073.dd"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2009.08197"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2013.830074"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2017.1383310"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2016.1264646"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2020.1789779"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2018.2829770"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2018.1436829"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2021.3124144"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1002\/wics.56"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/78.978374"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2018.1555384"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2021.3070532"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2013.876126"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2019.1630868"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1214\/ss\/1177012761"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3156039"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3221142"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3162283"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3159010"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1145\/1102351.1102479"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1177\/1475921718794953"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-020-01630-w"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2534258"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2020.3032157"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2014.2349733"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/PHM.2008.4711414"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/19\/10367905\/10710628-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10710628.pdf?arnumber=10710628","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T00:41:24Z","timestamp":1732668084000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10710628\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":51,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3472855","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}