{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T03:54:57Z","timestamp":1777262097942,"version":"3.51.4"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003093","name":"Ministry of Higher Education, Malaysia, through the Fundamental Research Grant Scheme","doi-asserted-by":"publisher","award":["FRGS\/1\/2024\/TK08\/MMU\/01\/1"],"award-info":[{"award-number":["FRGS\/1\/2024\/TK08\/MMU\/01\/1"]}],"id":[{"id":"10.13039\/501100003093","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3476571","type":"journal-article","created":{"date-parts":[[2024,10,9]],"date-time":"2024-10-09T17:47:44Z","timestamp":1728496064000},"page":"1-10","source":"Crossref","is-referenced-by-count":4,"title":["A New Distance Metric Based on Bias-Variance Tradeoff for Wireless Fingerprinting"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6926-3867","authenticated-orcid":false,"given":"Ai Hui","family":"Tan","sequence":"first","affiliation":[{"name":"Faculty of Engineering, Multimedia University, Cyberjaya, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.iot.2020.100334"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s21175707"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3024526"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s23031508"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/s20092698"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3280516"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3331392"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2019.2911558"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s20113203"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2951712"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2020.2993545"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMC.2011.243"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICUFN.2017.7993833"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3315289"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2021.107619"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2937464"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/109642"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2952221"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2015.2430171"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2015.08.013"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-03661-4"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/00207179.2019.1578407"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2022.3152430"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/data3010003"},{"key":"ref25","volume-title":"Long-term Wi-Fi fingerprinting dataset and supporting material","author":"Mendoza-Silva","year":"2017"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2660522"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3073324"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8090989"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3153362"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/PERCOM.2003.1192736"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2006.112"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/s16050737"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/data7110156"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3390\/data7110156"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10711948.pdf?arnumber=10711948","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T01:34:39Z","timestamp":1732671279000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10711948\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3476571","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}