{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,22]],"date-time":"2026-01-22T14:08:55Z","timestamp":1769090935875,"version":"3.49.0"},"reference-count":56,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100010002","name":"Funds of the Ministry of Education","doi-asserted-by":"publisher","award":["8091B042109"],"award-info":[{"award-number":["8091B042109"]}],"id":[{"id":"10.13039\/100010002","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100019339","name":"Tsinghua University Initiative Scientific Research Program","doi-asserted-by":"publisher","award":["2021Z11GHX002"],"award-info":[{"award-number":["2021Z11GHX002"]}],"id":[{"id":"10.13039\/501100019339","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3480191","type":"journal-article","created":{"date-parts":[[2024,10,14]],"date-time":"2024-10-14T17:23:31Z","timestamp":1728926611000},"page":"1-14","source":"Crossref","is-referenced-by-count":5,"title":["Detection of Rotational Doppler Frequency and Measurement With Broadened Spectrum"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3127-4584","authenticated-orcid":false,"given":"Ziyu","family":"Hua","sequence":"first","affiliation":[{"name":"Department of Precision Instruments, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-5827-298X","authenticated-orcid":false,"given":"Yu","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Precision Instruments, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9906-7875","authenticated-orcid":false,"given":"Yidong","family":"Tan","sequence":"additional","affiliation":[{"name":"Department of Precision Instruments, Tsinghua University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1887\/0750309016\/b1142c6"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1126\/science.1239936"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/photonics9070441"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1117\/1.oe.57.3.036103"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2024.108223"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/5.0009396"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.192349"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3141155"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.016504"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1515\/nanoph-2021-0622"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1612-202X\/aa741a"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.1.000001"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.010050"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/OE.527750"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/OL.390425"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.35848\/1882-0786\/ab6e0c"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1364\/OE.424943"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/S0079-6638(08)70391-3"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/lpor.201700183"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.10.044014"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1364\/AO.471059"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/OL.443022"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.34133\/2022\/9839502"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/app9010109"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1364\/OL.40.005778"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.64.043815"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2024.110721"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1364\/AO.438997"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1364\/OL.44.002346"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/0141-6359(90)90060-C"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3163732"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1364\/AO.45.007987"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1364\/AO.48.006479"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s11082-022-03512-2"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1364\/AO.45.002246"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1364\/OE.433244"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2023.107676"},{"key":"ref38","first-page":"200","article-title":"Intracavity dynamics-based optical phase amplifier with over tenfold","volume":"15","author":"Tan","year":"2019","journal-title":"Way"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.474243"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1364\/OE.461179"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1038\/lsa.2016.251"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1002\/adpr.202200049"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.015518"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2021.127414"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1364\/OE.476870"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1364\/AO.58.002650"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.024781"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.020098"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1088\/1674-1056\/acc1d0"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1364\/PRJ.4.0000B1"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1364\/OE.490063"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1364\/OE.520674"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1364\/AO.451170"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1364\/PRJ.461039"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3192677"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3114705"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10716688.pdf?arnumber=10716688","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T05:54:01Z","timestamp":1732686841000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10716688\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":56,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3480191","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}