{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,25]],"date-time":"2026-04-25T14:18:34Z","timestamp":1777126714733,"version":"3.51.4"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62271022"],"award-info":[{"award-number":["62271022"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3481564","type":"journal-article","created":{"date-parts":[[2024,10,16]],"date-time":"2024-10-16T17:55:37Z","timestamp":1729101337000},"page":"1-10","source":"Crossref","is-referenced-by-count":4,"title":["Measurement of Gas Fraction in Gas-Liquid Dispersed Bubbly Flow With EMAT Array and EIT Sensor"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9535-0764","authenticated-orcid":false,"given":"Yuedong","family":"Xie","sequence":"first","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8665-9081","authenticated-orcid":false,"given":"Fulu","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2288-1980","authenticated-orcid":false,"given":"Jiangtao","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2827-9651","authenticated-orcid":false,"given":"Peng","family":"Suo","sequence":"additional","affiliation":[{"name":"Hangzhou International Innovation Institute, Beihang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0488-9604","authenticated-orcid":false,"given":"Lijun","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-6692-9562","authenticated-orcid":false,"given":"Keyu","family":"Du","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5252-6448","authenticated-orcid":false,"given":"Hanyang","family":"Xu","sequence":"additional","affiliation":[{"name":"Beijing Liuhe Greatness Technology Company Ltd., Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3468-0617","authenticated-orcid":false,"given":"Jianyu","family":"Feng","sequence":"additional","affiliation":[{"name":"Beijing Liuhe Greatness Technology Company Ltd., Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0143-9659","authenticated-orcid":false,"given":"Haibo","family":"Liang","sequence":"additional","affiliation":[{"name":"Department of Intelligent Sensing Engineering, Southwest Petroleum University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2009.11.015"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.powtec.2018.09.057"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.petrol.2009.01.008"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2014.07.049"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3284935"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/i2mtc50364.2021.9459798"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3303529"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2020.3020361"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11431-009-0172-7"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2779868"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3063185"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0301-9322(99)00029-4"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2707665"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab3d63"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3056736"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmultiphaseflow.2020.103297"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.expthermflusci.2019.109912"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmultiphaseflow.2019.03.029"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.expthermflusci.2018.03.018"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijheatfluidflow.2018.04.011"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmultiphaseflow.2015.05.013"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.184.702"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2022.102631"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1121\/1.1907753"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1121\/1.1907754"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3314818"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3353831"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1088\/0143-0815\/8\/4A\/012"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/0034-4885\/68\/7\/R01"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1002\/ppsc.19940110308"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1021\/ie049131p"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1063\/1.1485767"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1017\/S0022112095001546"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3117069"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad191b"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10720023.pdf?arnumber=10720023","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T05:56:22Z","timestamp":1732686982000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10720023\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3481564","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}