{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,4]],"date-time":"2026-03-04T08:08:27Z","timestamp":1772611707754,"version":"3.50.1"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52371275"],"award-info":[{"award-number":["52371275"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3481573","type":"journal-article","created":{"date-parts":[[2024,10,16]],"date-time":"2024-10-16T17:55:37Z","timestamp":1729101337000},"page":"1-14","source":"Crossref","is-referenced-by-count":5,"title":["Transformer-Based Multiscale Reconstruction Network for Defect Detection of Infrared Images"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5788-6573","authenticated-orcid":false,"given":"Changyun","family":"Wei","sequence":"first","affiliation":[{"name":"College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-7223-8804","authenticated-orcid":false,"given":"Hui","family":"Han","sequence":"additional","affiliation":[{"name":"College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-2425-4658","authenticated-orcid":false,"given":"Zhichao","family":"Wu","sequence":"additional","affiliation":[{"name":"College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-7892-7943","authenticated-orcid":false,"given":"Yu","family":"Xia","sequence":"additional","affiliation":[{"name":"College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8968-9902","authenticated-orcid":false,"given":"Ze","family":"Ji","sequence":"additional","affiliation":[{"name":"School of Engineering, Cardiff University, Cardiff, U.K."}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/jimaging7020024"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.05.008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2873175"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2021.103754"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0263-8223(02)00161-7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2016.11.008"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2881341"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/nature14539"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3092510"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112725"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2915404"},{"key":"ref12","article-title":"Improving unsupervised defect segmentation by applying structural similarity to autoencoders","author":"Bergmann","year":"2018","journal-title":"arXiv:1807.02011"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3058147"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2018.2886031"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2019.8851808"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.media.2019.01.010"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-59050-9_12"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-20893-6_39"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3125987"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2020.11.018"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2020.107706"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-68799-1_35"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2021.12.008"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01392"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.02348"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.01954"},{"key":"ref29","first-page":"1","article-title":"An image is worth 16\u00d716 words: Transformers for image recognition at scale","volume-title":"Int. Conf. Learn. Represent.","author":"Dosovitskiy"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-06430-2_33"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3250225"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/en16114535"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00822"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s41095-022-0274-8"},{"key":"ref35","first-page":"214","article-title":"Wasserstein generative adversarial networks","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Arjovsky"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00982"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3171559"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10720055.pdf?arnumber=10720055","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T03:28:06Z","timestamp":1732678086000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10720055\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3481573","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}