{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T15:37:10Z","timestamp":1780587430499,"version":"3.54.1"},"reference-count":56,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62271504"],"award-info":[{"award-number":["62271504"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62101596"],"award-info":[{"award-number":["62101596"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62201616"],"award-info":[{"award-number":["62201616"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"Technology Innovation Leading Talent Project of Zhongyuan","doi-asserted-by":"publisher","award":["244200510015"],"award-info":[{"award-number":["244200510015"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3485407","type":"journal-article","created":{"date-parts":[[2024,10,25]],"date-time":"2024-10-25T17:22:05Z","timestamp":1729876925000},"page":"1-12","source":"Crossref","is-referenced-by-count":4,"title":["SVB: Self-Supervised Real CT Denoising via Similarity-Based Visual Blind-Spot Scheme"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9760-3910","authenticated-orcid":false,"given":"Yizhong","family":"Wang","sequence":"first","affiliation":[{"name":"Department of Henan Key Laboratory of Imaging and Intelligent Processing, Information Engineering University, Zhengzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1323-1655","authenticated-orcid":false,"given":"Shaoyu","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Henan Key Laboratory of Imaging and Intelligent Processing, Information Engineering University, Zhengzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6128-0876","authenticated-orcid":false,"given":"Ailong","family":"Cai","sequence":"additional","affiliation":[{"name":"Department of Henan Key Laboratory of Imaging and Intelligent Processing, Information Engineering University, Zhengzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1312-3558","authenticated-orcid":false,"given":"Kang","family":"An","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optoelectronic Technology and Systems, ICT Research Center, Ministry of Education, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-9398-2575","authenticated-orcid":false,"given":"Ningning","family":"Liang","sequence":"additional","affiliation":[{"name":"Department of Henan Key Laboratory of Imaging and Intelligent Processing, Information Engineering University, Zhengzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9470-6770","authenticated-orcid":false,"given":"Zhizhong","family":"Zheng","sequence":"additional","affiliation":[{"name":"Department of Henan Key Laboratory of Imaging and Intelligent Processing, Information Engineering University, Zhengzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5331-612X","authenticated-orcid":false,"given":"Lei","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Henan Key Laboratory of Imaging and Intelligent Processing, Information Engineering University, Zhengzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0393-9641","authenticated-orcid":false,"given":"Bin","family":"Yan","sequence":"additional","affiliation":[{"name":"Department of Henan Key Laboratory of Imaging and Intelligent Processing, Information Engineering University, Zhengzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3078555"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s11053-023-10169-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2007.49.10.589"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1148\/radiol.2511081296"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0749-4041(10)79278-2"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.crad.2016.05.002"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/trpms.2020.3020212"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tmi.2012.2187213"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tci.2019.2956886"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3221120"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3379388"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2022.3216887"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/jbhi.2022.3213595"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-87602-9_1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01208"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2018.2839891"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00265"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1118\/1.3232004"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2006.882141"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tmi.2014.2336860"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2014.2319055"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2005.38"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.901238"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1118\/1.4894714"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2017.2715284"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1038\/s42256-019-0057-9"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2827462"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3128703"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2015.2467219"},{"key":"ref30","article-title":"Noise entangled GAN for low-dose CT simulation","author":"Niu","year":"2021","journal-title":"arXiv:2102.09615"},{"issue":"3","key":"ref31","first-page":"4620","article-title":"Noise2Noise: Learning image restoration without clean data","volume-title":"Proc. 35th Int. Conf. Mach. Learn. (ICML)","author":"Lehtinen"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2022.3176533"},{"key":"ref33","article-title":"Blind2Sound: Self-supervised image denoising without residual noise","author":"Wang","year":"2023","journal-title":"arXiv:2303.05183"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/iccv.2019.00426"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2019.00223"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00207"},{"key":"ref37","first-page":"826","article-title":"Noise2Seif: Blind denoising by self-supervision","volume-title":"Proc. 36th Int. Conf. Mach. Learn. (ICML)","author":"Batson"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2020.3007326"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2020.3019647"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1002\/mp.14796"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/tmi.2022.3231428"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1002\/mp.16628"},{"key":"ref43","article-title":"Suppression of correlated noise with similarity-based unsupervised deep learning","author":"Niu","year":"2020","journal-title":"arXiv:2011.03384"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TRPMS.2021.3083361"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6560\/ac6d9b"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.52547\/ijrr.20.2.5"},{"issue":"1","key":"ref47","first-page":"1240","article-title":"Statistics at square one","volume":"1","author":"Edwards","year":"1976","journal-title":"Br. Med. J."},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1177\/875647939000600106"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2961837"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-87193-2_4"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2019.2913372"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1118\/1.2987668"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2662206"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3088914"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/iccvw54120.2021.00210"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10735234.pdf?arnumber=10735234","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,23]],"date-time":"2025-01-23T18:40:39Z","timestamp":1737657639000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10735234\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":56,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3485407","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}