{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T19:12:45Z","timestamp":1773256365333,"version":"3.50.1"},"reference-count":57,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100016692","name":"Key Research and Development Program of Shaanxi","doi-asserted-by":"publisher","award":["2021GY-131"],"award-info":[{"award-number":["2021GY-131"]}],"id":[{"id":"10.13039\/100016692","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Yulin Science and Technology Plan Project","award":["CXY-2020-037"],"award-info":[{"award-number":["CXY-2020-037"]}]},{"name":"Xi\u2019an Science and Technology Plan Project","award":["2020KJRC0068"],"award-info":[{"award-number":["2020KJRC0068"]}]},{"name":"Beilin District Science and Technology Plan Project","award":["GX2231"],"award-info":[{"award-number":["GX2231"]}]},{"DOI":"10.13039\/501100017592","name":"Innovation Capability Support Program of Shaanxi","doi-asserted-by":"publisher","award":["2020TD-021"],"award-info":[{"award-number":["2020TD-021"]}],"id":[{"id":"10.13039\/501100017592","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3485446","type":"journal-article","created":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T17:46:47Z","timestamp":1729705607000},"page":"1-16","source":"Crossref","is-referenced-by-count":6,"title":["DFKD: Dynamic Focused Knowledge Distillation Approach for Insulator Defect Detection"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9335-5411","authenticated-orcid":false,"given":"Bao","family":"Liu","sequence":"first","affiliation":[{"name":"College of Electrical and Control Engineering, Xi&#x2019;an University of Science and Technology, Xi&#x2019;an, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-3290-0030","authenticated-orcid":false,"given":"Wenqiang","family":"Jiang","sequence":"additional","affiliation":[{"name":"College of Electrical and Control Engineering, Xi&#x2019;an University of Science and Technology, Xi&#x2019;an, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2017.006840"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2019.2944741"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2021.3116600"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3298424"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2871750"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2016.2577031"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3112227"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3202958"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3191694"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2017.690"},{"key":"ref12","article-title":"YOLOv3: An incremental improvement","author":"Redmon","year":"2018","journal-title":"arXiv:1804.02767"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2004.10934"},{"key":"ref14","volume-title":"YOLOv5 Github","year":"2022"},{"key":"ref15","article-title":"YOLOX: Exceeding YOLO series in 2021","author":"Ge","year":"2021","journal-title":"arXiv:2107.08430"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2209.02976"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.00721"},{"key":"ref18","volume-title":"YOLOv8 Github","year":"2023"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3120796"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3201499"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3200861"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3194909"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2023.3328178"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2020.3016840"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/LWC.2021.3122957"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2022.3151619"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TNSM.2023.3332899"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3344570"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/s23115249"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108054"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1503.02531"},{"key":"ref32","article-title":"Rethinking soft labels for knowledge distillation: A bias-variance tradeoff perspective","author":"Zhou","year":"2021","journal-title":"arXiv:2102.00650"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01165"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.01576"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v37i2.25236"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2023.3248583"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.01575"},{"key":"ref38","article-title":"CrossKD: Cross-head knowledge distillation for object detection","author":"Wang","year":"2023","journal-title":"arXiv:2306.11369"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.754"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00938"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00460"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-20083-0_4"},{"key":"ref43","first-page":"15394","article-title":"PKD: General distillation framework for object detectors via Pearson correlation coefficient","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"35","author":"Cao"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00526"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-021-01453-z"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3055564"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2023.3257546"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2017.2765202"},{"key":"ref50","article-title":"Layer-adaptive sparsity for the magnitude-based pruning","author":"Lee","year":"2020","journal-title":"arXiv:2010.07611"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/tsmc.2020.3005231"},{"key":"ref52","article-title":"Insulator defect detection","author":"Lewis","year":"2021"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58580-8_33"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2020.3032166"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr52733.2024.01605"},{"key":"ref56","article-title":"MobileNetV4\u2014Universal models for the mobile ecosystem","author":"Qin","year":"2024","journal-title":"arXiv:2404.10518"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2016.90"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10731864.pdf?arnumber=10731864","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T01:58:29Z","timestamp":1732672709000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10731864\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":57,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3485446","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}