{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,11]],"date-time":"2026-02-11T19:07:31Z","timestamp":1770836851571,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["92271201"],"award-info":[{"award-number":["92271201"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Natural Science Basic Research Program of Shaanxi","award":["2024JC-JCQN-61"],"award-info":[{"award-number":["2024JC-JCQN-61"]}]},{"name":"Key Laboratory of Equipment Efficiency in Extreme Environment, Ministry of Education","award":["2023005"],"award-info":[{"award-number":["2023005"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3485455","type":"journal-article","created":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T17:46:47Z","timestamp":1729705607000},"page":"1-9","source":"Crossref","is-referenced-by-count":2,"title":["Tactile Electronic Skin With Curved Surface Compensation by In Situ Curvature Self-Sensing"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4350-8774","authenticated-orcid":false,"given":"Xiangyu","family":"Meng","sequence":"first","affiliation":[{"name":"School of Electronic Engineering, Xi’an University of Posts and Telecommunications, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5026-6881","authenticated-orcid":false,"given":"Hongyao","family":"Tang","sequence":"additional","affiliation":[{"name":"Science and Technology on Space Physics Laboratory, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3545-3280","authenticated-orcid":false,"given":"Xiaozhou","family":"L\u00fc","sequence":"additional","affiliation":[{"name":"School of Aerospace Science and Technology, Xidian University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2169-2515","authenticated-orcid":false,"given":"Yaoguang","family":"Shi","sequence":"additional","affiliation":[{"name":"School of Aerospace Science and Technology, Xidian University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1851-1330","authenticated-orcid":false,"given":"Weimin","family":"Bao","sequence":"additional","affiliation":[{"name":"School of Aerospace Science and Technology, Xidian University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984427"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2015.2433611"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2750631"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3186049"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3711"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3265759"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.abe1655"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3147329"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2834"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3227880"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3045962"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.cej.2020.126777"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-023-39675-z"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2019.104429"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2022.107683"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201904626"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1039\/C6TC04272D"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1021\/nn500441k"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.compscitech.2022.109679"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/smll.202305925"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.0c02774"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2020.104743"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.9b21474"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.18494\/SAM.2018.2033"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3154677"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201601115"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200305409"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.nantod.2014.04.009"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1039\/C8CS00706C"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2784341"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1088\/978-0-7503-2707-7"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10731717.pdf?arnumber=10731717","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T01:31:16Z","timestamp":1732671076000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10731717\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3485455","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}