{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,8]],"date-time":"2026-08-08T18:08:48Z","timestamp":1786212528951,"version":"3.56.0"},"reference-count":82,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62076122"],"award-info":[{"award-number":["62076122"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61802174"],"award-info":[{"award-number":["61802174"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Research Funding of Nanjing Institute of Technology","award":["YKJ201982"],"award-info":[{"award-number":["YKJ201982"]}]},{"name":"Basic Science (Natural Science) Research Project of Higher Education Institutions in Jiangsu Province","award":["24KJA520003"],"award-info":[{"award-number":["24KJA520003"]}]},{"name":"Graduate Education Teaching Reform Project of Nanjing Institute of Technology","award":["2023YJYJG07"],"award-info":[{"award-number":["2023YJYJG07"]}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2242024k30027"],"award-info":[{"award-number":["2242024k30027"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013088","name":"Qing Lan Project in Jiangsu Province","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100013088","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3488136","type":"journal-article","created":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T17:50:27Z","timestamp":1730310627000},"page":"1-17","source":"Crossref","is-referenced-by-count":83,"title":["SSA-YOLO: An Improved YOLO for Hot-Rolled Strip Steel Surface Defect Detection"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8897-3517","authenticated-orcid":false,"given":"Xiaohua","family":"Huang","sequence":"first","affiliation":[{"name":"School of International Education and Oulu School, Nanjing Institute of Technology, Nanjing, Jiangsu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-3278-2201","authenticated-orcid":false,"given":"Jiahao","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of International Education and Oulu School, Nanjing Institute of Technology, Nanjing, Jiangsu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9668-2012","authenticated-orcid":false,"given":"Ying","family":"Huo","sequence":"additional","affiliation":[{"name":"School of Computer Engineering, Nanjing Institute of Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2963555"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2022.106047"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/ipr2.12647"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2218677"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2013.09.002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2898215"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2020.103231"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2023.3238524"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01264-9_45"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.322"},{"key":"ref13","first-page":"1","article-title":"Faster R-CNN: Towards real-time object detection with region proposal networks","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"28","author":"Ren"},{"key":"ref14","article-title":"YOLOv3: An incremental improvement","author":"Redmon","year":"2018","journal-title":"arXiv:1804.02767"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2004.10934"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109454"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01350"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1807.06521"},{"key":"ref19","first-page":"11863","article-title":"SimAM: A simple, parameter-free attention module for convolutional neural networks","volume-title":"Proc. 38th Int. Conf. Mach. Learn.","author":"Yang"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00069"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01155"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2024.108248"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.106"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s40747-024-01409-z"},{"key":"ref25","article-title":"Learning spatial fusion for single-shot object detection","author":"Liu","year":"2019","journal-title":"arXiv:1911.09516"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00278"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.81"},{"key":"ref28","first-page":"235","article-title":"Strip steel surface defect detection based on improved mask R-CNN algorithm","volume":"57","author":"Weng","year":"2021","journal-title":"Comput. Eng. Appl"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3277989"},{"issue":"10","key":"ref30","first-page":"754","article-title":"Steel surface defect detection algorithm based on FF R-CNN","volume":"52","author":"Han","year":"2021","journal-title":"J. Taiyuan Univ. Technol."},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICCR55715.2022.10053878"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2022.103718"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2915404"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ITNEC56291.2023.10082274"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111959"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112776"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2022.108208"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.105628"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2023.102280"},{"key":"ref40","article-title":"Neural machine translation by jointly learning to align and translate","author":"Bahdanau","year":"2014","journal-title":"arXiv:1409.0473"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.matlet.2021.129707"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1049\/ipr2.12715"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3347747"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00745"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2022.3152247"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00986"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-10602-1_48"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-72751-1_1"},{"key":"ref50","article-title":"YOLOv10: Real-time end-to-end object detection","author":"Wang","year":"2024","journal-title":"arXiv:2405.14458"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01599"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109185"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac0ca8"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2023.110578"},{"key":"ref55","article-title":"PP-YOLOE: An evolved version of YOLO","author":"Xu","year":"2022","journal-title":"arXiv:2203.16250"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3391353"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3374869"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.l007\/978-3-319-46448-0_2"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3040485"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110211"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.01100"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2022.3216771"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.01816"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.00606"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2022.3183022"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.00297"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/5592878"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00091"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01420"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3127648"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3398131"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01605"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3176239"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3346470"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3228206"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1049\/ipr2.13073"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1109\/EEBDA56825.2023.10090524"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1007\/s10586-023-04181-w"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2021.3136823"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3300421"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3204332"},{"key":"ref82","article-title":"A PCB dataset for defects detection and classification","author":"Huang","year":"2019","journal-title":"arXiv:1901.08204"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10739337.pdf?arnumber=10739337","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T07:17:43Z","timestamp":1742973463000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10739337\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":82,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3488136","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}