{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T16:25:39Z","timestamp":1783009539851,"version":"3.54.5"},"reference-count":50,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52405601"],"award-info":[{"award-number":["52405601"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51975487"],"award-info":[{"award-number":["51975487"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U2034210"],"award-info":[{"award-number":["U2034210"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"Ministry of Education Opening Project of Key Laboratory of Nondestructive Testing","doi-asserted-by":"publisher","award":["EW202280374"],"award-info":[{"award-number":["EW202280374"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2022M722633"],"award-info":[{"award-number":["2022M722633"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2024.3500038","type":"journal-article","created":{"date-parts":[[2024,11,18]],"date-time":"2024-11-18T18:53:14Z","timestamp":1731955994000},"page":"1-8","source":"Crossref","is-referenced-by-count":9,"title":["Autostaggering Fringe-Order Method Avoids Phase-Jump Errors for Code-Based Fringe Projection Profilometry"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4597-9115","authenticated-orcid":false,"given":"Ji","family":"Deng","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering and the Technology and Equipment of Rail Transit Operation and Maintenance Key Laboratory of Sichuan Province, Southwest Jiaotong University, Chengdu, Sichuan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7519-8248","authenticated-orcid":false,"given":"Yu","family":"Xiao","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering, North China Institute of Aerospace Engineering, Langfang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3110-7316","authenticated-orcid":false,"given":"Chunjun","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering and the Technology and Equipment of Rail Transit Operation and Maintenance Key Laboratory of Sichuan Province, Southwest Jiaotong University, Chengdu, Sichuan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-3169-8210","authenticated-orcid":false,"given":"Jingrui","family":"Gou","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering and the Technology and Equipment of Rail Transit Operation and Maintenance Key Laboratory of Sichuan Province, Southwest Jiaotong University, Chengdu, Sichuan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00415"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3291007"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s41377-018-0072-3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.398644"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/photonics10070801"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3185660"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/s41377-023-01294-0"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.29026\/oea.2024.230034"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1117\/1.APN.2.3.036010"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/s41377-022-00714-x"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/OE.420127"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2017.05.046"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.018445"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.63.1.014101"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/OL.446022"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2023.114156"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111525"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2022.106995"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2023.107591"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.05.019"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2011.06.024"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.022631"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.001283"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.105982"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1364\/OE.408835"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2024.3381773"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3032185"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.110767"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.028613"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.03.018"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2024.3389609"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2023.107967"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1364\/OE.482158"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1364\/OL.35.000934"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.004700"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2017.10.013"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2020.107959"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3056063"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2023.107741"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2024.3375375"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.105999"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2018.12.058"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1364\/AO.506820"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-023-17468-2"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1364\/PRJ.389076"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1364\/OE.539185"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1364\/OE.436116"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2021.106873"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2023.110248"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2023.107623"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/10755219.pdf?arnumber=10755219","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,29]],"date-time":"2024-11-29T18:51:09Z","timestamp":1732906269000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10755219\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":50,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3500038","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}